Chemical mapping
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GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Electron Backscatter Diffraction, surface analysis, Fracture Mechanics, ... Features: HV, Non Destructive, ... Techniques: Microscopy, Atomic Force Microscopy, Scanning Electron Microscopy, ...
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Scienta Omicron Scienta Omicron ARPES Systems Applications: Microscopy, Chemical mapping, ... Features: Automation, Vacuum, ... Techniques: , , X-ray Photoelectron Spectroscopy (XPS), ...
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Scienta Omicron Scienta Omicron HiPP-Lab Applications: Chemical mapping, Microscopy, ... Features: Temperature Control, Automation, ... Techniques: X-ray Photoelectron Spectroscopy (XPS), X-ray Photoelectron Spectroscopy (XPS), X-ray Photoelectron Spectroscopy (XPS), ...
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Scienta Omicron Scienta Omicron NanoSAM Lab Chemical Analysis with Ultimate Resolution Applications: Microscopy, Chemical mapping, ... Features: , Temperature Control, ... Techniques: X-ray Photoelectron Spectroscopy (XPS), X-ray Photoelectron Spectroscopy (XPS), ...
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Scienta Omicron Scienta Omicron XPS Systems Applications: Microscopy, Chemical mapping, ... Features: Vacuum, Temperature Control, ... Techniques: , X-ray Photoelectron Spectroscopy (XPS), X-ray Photoelectron Spectroscopy (XPS), ...