surface analysis
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Lake Shore 8400 Series HMS Applications: Nanoscience, Semiconductors, Electrical Characterization, ... Features: Magnetic fields, ... Techniques: Torque magnetometry, Magnetometry, Electrical transport, ... -
CS Instruments AFM Galaxy Dual Controller The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software. Applications: surface analysis, Semiconductors, Electronics, ... Features: Non Destructive, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Nanoscience, Thin films, Spectroscopy, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design FusionScope FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Applications: Quality control of the product, Spintronics / magneto-electronics, Semiconductors, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Microscopy, Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Nanoscience, Thin films, Microscopy, ... Features: Non Destructive, Automation, ... Techniques: Scanning Electron Microscopy, Microscopy, Atomic Force Microscopy, ... -
HEX Series The HEX platform offers an unmatched level of user control and customization, designed to incorporate the latest thin film technologies and performance into a bench top PVD system. Applications: Thin films, Nanoscience, Coating, ... Features: Compact and easy-to-use, Excellent temperature uniformity, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: surface analysis, Optical crystals, Nanoscience, ... Features: Fast Spectral Detection, Imaging, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. Applications: Coating, Nanoscience, Thin films, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: surface analysis, Catalysis, Semiconductors, ... Features: Compact and easy-to-use, Imaging, ... Techniques: Atomic Force Microscopy, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Liquid crystal, Coating, Quality control of the product, ... Features: Imaging, Low temperature, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
icspi Redux AFM Motorized AFM on your benchtop. Get the data you need even faster with Redux. Applications: Nano-Indentation, Electronics, Fracture Mechanics, ... Features: Compact / Portable, Compact and easy-to-use, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Janis ST-100 Optical Cryostat Applications: Thin films, Spectroscopy, Fluorescence/Phosphorescence lifetime imaging, ... Features: Thermal Stability, Low temperature, ... Techniques: Optical spectroscopy, Optical spectroscopy, Microscopy, ...