Imaging
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CS Instruments AFM Galaxy Dual Controller The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software. Applications: Aerospace, Semiconductors, surface analysis, ... Features: Imaging, Non Destructive, ... Techniques: Microscopy, Atomic Force Microscopy, ...
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Quantum Design FusionScope FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Applications: Nanoscience, Semiconductors, Electrical Characterization, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Microscopy, Atomic Force Microscopy, Electron beam, ...
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GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Nano-Indentation, Magnetic properties, Electrical Characterization, ... Features: Vacuum, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, Scanning Electron Microscopy, ...
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Enlitech Image Sensor / Fingerprint-on-Display Testing The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations. Applications: Coating, Electronics, Photon experiments, ... Features: Compact / Portable, Customizable chamber, ... Techniques: Sensor Tester, ...
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J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Quality control of the product, Liquid crystal, Spectroscopy, ... Features: , Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ...
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CS Instruments Nano-Observer AFM The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. Applications: Nanoscience, Semiconductors, Thin films, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ...
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icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Catalysis, Semiconductors, Quality control of the product, ... Features: Imaging, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, ...
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Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution QE-R quantum efficiency system is a PV cell tester which can provide cell’s EQE. IPCE, IQE and spectral response data accurately and rapidly. Applications: Electrical Characterization, Intermetallics, Electronics, ... Features: Customizable chamber, Compact / Portable, ... Techniques: Sensor Tester, ...
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J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Liquid crystal, Coating, Nanoscience, ... Features: Flexible System Integration, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...
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Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator With the rapid development of high-efficiency tandem solar cells, especially perovskite/crystalline silicon tandem solar cells, the need for accurate measurement of the conversion efficiency of tandem cells has attracted a lot of attention. Applications: Electronics, Spectroscopy, Finding new material, ... Features: Non Destructive, Compact / Portable, ... Techniques: Solar Simulator, ...