Non Destructive
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CS Instruments AFM Galaxy Dual Controller The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software. Applications: Semiconductors, Thin films, surface analysis, ... Features: No External Cooling Requirements, Automation, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Quality control of the product, Nanoscience, Spectroscopy, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Even though SEM with higher magnification is used, wet materials need to be dried before inspection since their structure (e.g., cell membranes or cell walls) will be damaged in a vacuum environment. The technical barrier that the sample cannot be observed in its original state still exists. Applications: Microscopy, Material inspection, Healthcare, ... Features: Non Destructive, Compact / Portable, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Electrical Characterization, Thin films, Microscopy, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Microscopy, Scanning Electron Microscopy, Atomic Force Microscopy, ... -
Enlitech Image Sensor / Fingerprint-on-Display Testing The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations. Applications: Material inspection, Finding new material, Coating, ... Features: Customizable chamber, Non Destructive, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Liquid crystal, Spectroscopy, Optical crystals, ... Features: Fast Spectral Detection, Imaging, ... Techniques: Spectroscopic ellipsometry, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Catalysis, Quality control of the product, Nano-Indentation, ... Features: Non Destructive, Imaging, ... Techniques: Atomic Force Microscopy, ... -
Quantum Design OptiCool - 7 Tesla Optical Cryostat Applications: Magnetic properties, Photon experiments, Semiconductors, ... Features: Magnetic fields, Low temperature, ... Techniques: Microscopy, Magneto resistance, Optical spectroscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution QE-R quantum efficiency system is a PV cell tester which can provide cell’s EQE. IPCE, IQE and spectral response data accurately and rapidly. Applications: Intermetallics, Material inspection, Electronics, ... Features: Compact / Portable, Non Destructive, ... Techniques: Sensor Tester, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: surface analysis, Spectroscopy, Nanoscience, ... Features: Flexible System Integration, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator With the rapid development of high-efficiency tandem solar cells, especially perovskite/crystalline silicon tandem solar cells, the need for accurate measurement of the conversion efficiency of tandem cells has attracted a lot of attention. Applications: Coating, Material inspection, Finding new material, ... Features: Non Destructive, Compact / Portable, ... Techniques: Solar Simulator, ...