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Application Notes To Download
- General Notes
General Notes
- Accurate Electron-Beam Lithography and Microscopy5004-001
- App Note brochure5004-002
- Atom Probe Tomography5004-003
- Beam Steering with Customized Positioners5004-004
- Closed-Loop XY-Stage Control with Yaw Rotation Tracking5004-005
- Deformation Detection of Satellite Flight Instruments5004-006
- Fiber Alignment with Micrometer Precision5004-007
- Measuring the Deformation of a Magnetically Levitated Plate5004-008
- Micro X-Ray Fluorescence Analysis Spectrometer5004-009
- Overview on Positioners’ and Electronics’ Connectors, and Cabling5004-010
- Piezo-based Positioning for Magnetic Field Detection5004-011
- Position Capturing in Coordinate Measurement Machines5004-012
- Powerful Electromagnetic Linear Stage5004-013
- Wide-field micrsocopy with the attoDRY800 optical cryostat5004-014