Products | Electrical Characterization | Quantum Design - Latin America

GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Nano-Indentation, Electronics, Finding new material, ... Features: Vibration Stability, High Z Resolution, ... Techniques: Atomic Force Microscopy, Scanning Electron Microscopy, Energy-dispersive X-ray spectroscopy (EDS), ...