Products | surface analysis | Quantum Design - Latin America

GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Thin films, Microscopy, Chemical mapping, ... Features: Compact / Portable, Correlative Analysis, ... Techniques: Energy-dispersive X-ray spectroscopy (EDS), Microscopy, Scanning Electron Microscopy, ...
Tohoku Tohoku CLA-FL2 Applications: Detect an electron irradiation history, Material inspection, Quality control of the product, ... Features: Ultra high sensibility, Temperature Control, ... Techniques: Chemiluminescence, ...
Tohoku Tohoku CLA-FS4 Applications: Quality control of the product, Material inspection, Detect an electron irradiation history, ... Features: Temperature Control, Ultra high sensibility, ... Techniques: Chemiluminescence, ...
Tohoku Tohoku CLA-ID4 Applications: Material inspection, Quality control of the product, Finding new material, ... Features: Ultra high sensibility, Temperature Control, ... Techniques: Chemiluminescence, ...
Tohoku Tohoku CLA-IMG Applications: Quality control of the product, Healthcare, Estimate stability for new material under R&D, ... Features: Ultra high sensibility, Temperature Control, ... Techniques: Chemiluminescence, ...
Tohoku Tohoku CLA-SP3 Applications: Finding new material, Estimate stability for new material under R&D, Healthcare, ... Features: Temperature Control, Ultra high sensibility, ... Techniques: Chemiluminescence, ...