J.A. Woolam
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J.A. Woolam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Coating, Optical crystals, Quality control of the product, ... Features: Remote Access, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woolam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Nanoscience, surface analysis, Coating, ... Features: Fast Spectral Detection, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woolam RC2 The RC2 design builds on 25 years of experience. Applications: Spectroscopy, Nanoscience, Liquid crystal, ... Features: Non Destructive, Low temperature, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...