Products | J.A. Woolam | Quantum Design - Latin America

J.A. Woolam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Thin films, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...
J.A. Woolam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: , Coating, Thin films, ... Features: , Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ...
J.A. Woolam RC2 The RC2 design builds on 25 years of experience. Applications: Liquid crystal, Thin films, ... Features: ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...