J.A. Woolam
-
J.A. Woolam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Coating, surface analysis, Thin films, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woolam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Liquid crystal, surface analysis, Thin films, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woolam RC2 The RC2 design builds on 25 years of experience. Applications: Liquid crystal, Coating, Quality control of the product, ... Features: , Wide Spectral Range, ... Techniques: , , Spectroscopic ellipsometry, ...