Products | Atomic Force Microscopy | Quantum Design - Latin America

GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Intermetallics, Fracture Mechanics, Nanoscience, ... Features: Vacuum, Correlative Analysis, ... Techniques: Energy-dispersive X-ray spectroscopy (EDS), Scanning Electron Microscopy, Microscopy, ...