Scanning Electron Microscopy
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GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Magnetic properties, Electron Backscatter Diffraction, Electronics, ... Features: Imaging, Non Destructive, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Energy-dispersive X-ray spectroscopy (EDS), ... -
Neomicra smile2 Adds electron beam lithography capability to any existing electron microscope and FIBs Applications: Spintronics / magneto-electronics, Thin films, Microscopy, ... Features: Vacuum, High reproducibility, ... Techniques: Scanning Electron Microscopy, Electron beam, ...