Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Spectroscopy, Coating, Quality control of the product, ... Features: Non Destructive, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Intermetallics, Magnetic properties, Patterned magnetic media, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Spintronics / magneto-electronics, Patterned magnetic media, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Spintronics / magneto-electronics, Intermetallics, Finding new material, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Microscopy, Atomic Force Microscopy, ...
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Arradiance GEMStar XT-P Benchtop Atomic Layer Deposition Applications: Coating, Magnetoresistance, Catalysis, ... Features: 300 Watt Air Cooled Direct ICP Head with four metal sealed mass flow controlled plasma gas inputs, Pulsed Vapor Push (PVPTM) to handle very low pressure material, ... Techniques: , ... -
Arradiance GEMStar XT-R Benchtop Atomic Layer Deposition Applications: Thin films, Magnetic properties, Coating, ... Features: , Pulsed Vapor Push (PVPTM) to handle very low pressure material, ... Techniques: , ... -
Arradiance GEMStar XT-S Benchtop Atomic Layer Deposition Applications: Coating, Catalysis, Microscopy, ... Features: 300 Watt Air Cooled Direct ICP Head with four metal sealed mass flow controlled plasma gas inputs, Pulsed Vapor Push (PVPTM) to handle very low pressure material, ... Techniques: , ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: surface analysis, Nanoscience, Semiconductors, ... Features: Heating option, Customizable chamber, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
Enlitech Image Sensor / Fingerprint-on-Display Testing World's First Commercial CMOS Image Sensor Tester Applications: Material inspection, Coating, Finding new material, ... Features: Non Destructive, Imaging, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Liquid crystal, Thin films, Spectroscopy, ... Features: Flexible System Integration, Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Microscopy, surface analysis, Coating, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: surface analysis, Coating, Nanoscience, ... Features: Compact / Portable, Compact and easy-to-use, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution PV Cell Tester Applications: Electronics, Coating, Electrical Characterization, ... Features: Non Destructive, Compact / Portable, ... Techniques: Sensor Tester, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Coating, Finding new material, Thin films, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Magnetic properties, Nanoscience, Thin films, ... Features: Magnetic fields, Vibration Stability, ... Techniques: , Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Spectroscopy, Quality control of the product, Nanoscience, ... Features: Low temperature, Non Destructive, ... Techniques: , , Spectroscopic ellipsometry, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Nano-Indentation, Intermetallics, Electronics, ... Features: Automation, Compact and easy-to-use, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator High Standard Solar Simulator Applications: Intermetallics, Spectroscopy, Electrical Characterization, ... Features: Compact / Portable, Non Destructive, ... Techniques: Solar Simulator, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , Thin films, Thin films, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...