Biotechnology & Chemistry
-
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, surface analysis, Electrical Characterization, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Electron beam, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Quantum optics, surface analysis, Semiconductors, ... Features: Magnetic fields, Imaging, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Electronics, Finding new material, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Coating, surface analysis, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Professional Scientific and Technical Services, ... -
Lake Shore VPF Series Cryostat Systems Sample in Vacuum Cryostat Applications: Intermetallics, Microscopy, Fluorescence/Phosphorescence lifetime imaging, ... Features: Low temperature, Vacuum, ... Techniques: Electrical transport, Microscopy, Optical spectroscopy, ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Electronics, Semiconductors, Finding new material, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: ...
