Material inspection
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FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Quality control of the product, Material inspection, Healthcare, ... Features: Non Destructive, Compact / Portable, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Finding new material, Electrical Characterization, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Microscopy, Professional Scientific and Technical Services, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, surface analysis, Microscopy, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Nanopositioners, Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, surface analysis, Nano-Indentation, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Electron beam, Professional Scientific and Technical Services, Nanopositioners, ...
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Lake Shore Gaussmeters/Teslameters Ease of Operation and Convenient Integration Applications: Magnetic properties, Material inspection, ... Features: Magnetic fields, ... Techniques: Magnetometry, ... -
Lake Shore Helmholtz and Search Coils High Accuracy and Uniformity Coils Applications: Material inspection, Magnetic properties, ... Features: Magnetic fields, ... Techniques: Magnetometry, ... -
Enlitech Image Sensor / Fingerprint-on-Display Testing World's First Commercial CMOS Image Sensor Tester Applications: Intermetallics, Photon experiments, Coating, ... Features: Compact / Portable, Imaging, ... Techniques: Sensor Tester, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Microscopy, Thin films, Fracture Mechanics, ... Features: Imaging, Non Destructive, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution PV Cell Tester Applications: Electronics, Photon experiments, Finding new material, ... Features: Customizable chamber, Imaging, ... Techniques: Sensor Tester, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Coating, Microscopy, Microscopy, ... Features: Magnetic fields, Vibration Stability, ... Techniques: , Microscopy, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Nano-Indentation, Nanoscience, Material inspection, ... Features: Compact / Portable, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator High Standard Solar Simulator Applications: Electrical Characterization, Finding new material, Photon experiments, ... Features: Customizable chamber, Compact / Portable, ... Techniques: Solar Simulator, ...