Nano-Indentation
-
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Finding new material, Patterned magnetic media, Coating, ... Features: Vibration Stability, Imaging, ... Techniques: Professional Scientific and Technical Services, Microscopy, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Electron Backscatter Diffraction, Magnetic properties, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Microscopy, Professional Scientific and Technical Services, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Electrical Characterization, Spintronics / magneto-electronics, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Professional Scientific and Technical Services, ...
-
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Quality control of the product, Fracture Mechanics, Thin films, ... Features: Imaging, Non Destructive, ... Techniques: Atomic Force Microscopy, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Nano-Indentation, Intermetallics, Catalysis, ... Features: Automation, Compact / Portable, ... Techniques: Microscopy, Atomic Force Microscopy, ...