Quality control of the product
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Liquid crystal, Coating, Quality control of the product, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Healthcare, Material inspection, Quality control of the product, ... Features: Flexible System Integration, Non Destructive, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Intermetallics, Material inspection, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Atomic Force Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Quality control of the product, Electronics, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Intermetallics, Quality control of the product, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Electron beam, ...
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Hirst Magnetics Generation 8 Hirst Pulsed Field Magnetometers (PFM) Magnetic Hysteresis Measurement Applications: Magnetic properties, Quality control of the product, ... Features: Magnetic fields, Temperature Control, ... Techniques: Magnetometry, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Nanoscience, surface analysis, Thin films, ... Features: Non Destructive, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Nanoscience, surface analysis, Nano-Indentation, ... Features: No External Cooling Requirements, Automation, ... Techniques: Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Nanoscience, Spectroscopy, Thin films, ... Features: Imaging, Non Destructive, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Magritek Spinsolve 60 Benchtop NMR Without Any Maintenance Applications: Spectroscopy, Quality control of the product, Fluorescence/Phosphorescence lifetime imaging, ... Features: Thermal Stability, Temperature Control, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 80 Benchtop NMR Without Any Maintenance Applications: Fluorescence/Phosphorescence lifetime imaging, Quality control of the product, Nuclear magnetic resonance (NMR), ... Features: Temperature Control, Remote Access, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 90 High Performance Benchtop NMR Applications: Fluorescence/Phosphorescence lifetime imaging, Nuclear magnetic resonance (NMR), Quality control of the product, ... Features: Compact / Portable, Fast Spectral Detection, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Semiconductors, Electronics, Thin films, ... Features: Compact / Portable, No External Cooling Requirements, ... Techniques: ...