surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Thin films, Electrical Characterization, Magnetoresistance, ... Features: Magnetic fields, ... Techniques: Torque magnetometry, AC Susceptibility, Magnetometry, ...
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Aerospace, Semiconductors, surface analysis, ... Features: Automation, Non Destructive, ... Techniques: Atomic Force Microscopy, Microscopy, ...
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Optical crystals, Liquid crystal, surface analysis, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Material inspection, Electrical Characterization, Intermetallics, ... Features: Vibration Stability, Imaging, ... Techniques: Electron beam, Nanopositioners, Atomic Force Microscopy, ...
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Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Quality control of the product, Semiconductors, Electronics, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Electron beam, Scanning Electron Microscopy, Atomic Force Microscopy, ...
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Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Magnetic properties, Finding new material, ... Features: Vibration Stability, Imaging, ... Techniques: Microscopy, Scanning Electron Microscopy, Nanopositioners, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Nanoscience, Thin films, surface analysis, ... Features: Excellent temperature uniformity, Thermal Stability, ... Techniques: Sputtering, Physical Vapor Deposition, ...
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J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: surface analysis, Thin films, Optical crystals, ... Features: Imaging, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ...
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CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Spectroscopy, Coating, Microscopy, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ...
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ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Catalysis, Intermetallics, Nano-Indentation, ... Features: Automation, Imaging, ... Techniques: Atomic Force Microscopy, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: surface analysis, Thin films, Spintronics / magneto-electronics, ... Features: Ultra high sensibility, Magnetic fields, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ...
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Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Nanoscience, Magnetic properties, Finding new material, ... Features: Vibration Stability, Magnetic fields, ... Techniques: , Microscopy, ...
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J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Nanoscience, Coating, ... Features: Low temperature, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...
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ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Electronics, Nano-Indentation, Intermetallics, ... Features: Automation, Compact and easy-to-use, ... Techniques: Microscopy, Atomic Force Microscopy, ...
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Janis ST-100 Optical Cryostat Applications: Spectroscopy, Intermetallics, Fluorescence/Phosphorescence lifetime imaging, ... Features: Vacuum, Temperature Control, ... Techniques: Microscopy, Microscopy, Optical spectroscopy, ...