Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: Material inspection, Semiconductors, Intermetallics, ...
Features: SEM Charge-up prevention, Correlative Analysis, ...
Techniques: Microscopy, Atomic Force Microscopy, Nanopositioners, ...
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Material inspection, Semiconductors, Intermetallics, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Microscopy, Atomic Force Microscopy, Nanopositioners, ...
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Quality control of the product, Microscopy, ... Features: Imaging, Vibration Stability, ... Techniques: Electron beam, Atomic Force Microscopy, Nanopositioners, ...