Correlative Analysis
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nanoscience, Semiconductors, surface analysis, ... Features: Imaging, Correlative Analysis, ... Techniques: Microscopy, Electron beam, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Nano-Indentation, Finding new material, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Magnetic properties, Nanoscience, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Microscopy, Nanopositioners, Scanning Electron Microscopy, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Coating, Patterned magnetic media, Thin films, ... Features: Magnetic fields, Non Destructive, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ...