Ultra high sensibility
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electrical Characterization, Patterned magnetic media, Material inspection, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Intermetallics, Electron Backscatter Diffraction, Electrical Characterization, ... Features: Imaging, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Electron beam, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Electrical Characterization, Semiconductors, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Nanopositioners, Atomic Force Microscopy, Scanning Electron Microscopy, ...
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Quantum Design OptiCool - 7 Tesla Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Spintronics / magneto-electronics, Thin films, Microscopy, ... Features: Temperature Control, Magnetic fields, ... Techniques: Magnetometry, Optical spectroscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetoresistance, Magnetic properties, Spintronics / magneto-electronics, ... Features: Correlative Analysis, Non Destructive, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...