Nanopositioners
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Material inspection, Thin films, Finding new material, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Nanopositioners, ... -
Montana Instruments CryoAdvance High Mechanical and Thermal Stability from 3.6 to 300 k Applications: Photon experiments, Semiconductors, Spectroscopy, ... Features: Cryogen free, Magnetic fields, ... Techniques: Nanopositioners, Mossbauer spectroscopy, Optical spectroscopy, ... -
Montana Instruments Cryostation® s200 Versatile Optical Cryostat For a Wide Range of Experiments Applications: Thin films, Spectroscopy, Semiconductors, ... Features: Customizable chamber, Cryogen free, ... Techniques: Mossbauer spectroscopy, Optical spectroscopy, Magneto-Optic Kerr Effect (MOKE), ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Electron Backscatter Diffraction, Electronics, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Microscopy, Electron beam, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Spintronics / magneto-electronics, Electronics, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Professional Scientific and Technical Services, ...