Professional Scientific and Technical Services
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Spintronics / magneto-electronics, Intermetallics, Nano-Indentation, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Electron beam, Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Spintronics / magneto-electronics, Magnetic properties, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Spintronics / magneto-electronics, Magnetic properties, surface analysis, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Microscopy, Electron beam, Scanning Electron Microscopy, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Patterned magnetic media, Nanoscience, Magnetic properties, ... Features: Non Destructive, Magnetic fields, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Mutech Microsystems µAligner Compact Mask Aligner for Microfabrication Applications: Spintronics / magneto-electronics, Thin films, Aerospace, ... Features: Compact / Portable, Compact and easy-to-use, ... Techniques: Air Transportation, Professional Scientific and Technical Services, Computer and Electronic Product Manufacturing, ...