Scanning Electron Microscopy
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FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Microscopy, Quality control of the product, Material inspection, ... Features: Compact / Portable, Flexible System Integration, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nano-Indentation, Magnetic properties, Patterned magnetic media, ... Features: Imaging, Vibration Stability, ... Techniques: Electron beam, Scanning Electron Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Nanoscience, Nano-Indentation, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Quality control of the product, Microscopy, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Electron beam, Nanopositioners, ...