Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Thin films, Spectroscopy, surface analysis, ... Features: Remote Access, Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Material inspection, Thin films, Microscopy, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Scanning Electron Microscopy, Microscopy, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Patterned magnetic media, Material inspection, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Spintronics / magneto-electronics, Electrical Characterization, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Nanopositioners, Electron beam, Atomic Force Microscopy, ...
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Arradiance GEMStar XT-P Benchtop Atomic Layer Deposition Applications: Microscopy, Magnetic properties, Optical crystals, ... Features: 300 Watt Air Cooled Direct ICP Head with four metal sealed mass flow controlled plasma gas inputs, 300 Watt Air Cooled Direct ICP Head with four metal sealed mass flow controlled plasma gas inputs, ... Techniques: , ... -
Arradiance GEMStar XT-R Benchtop Atomic Layer Deposition Applications: Coating, Magnetoresistance, Catalysis, ... Features: 300 Watt Air Cooled Direct ICP Head with four metal sealed mass flow controlled plasma gas inputs, 300 Watt Air Cooled Direct ICP Head with four metal sealed mass flow controlled plasma gas inputs, ... Techniques: , ... -
Arradiance GEMStar XT-S Benchtop Atomic Layer Deposition Applications: Magnetoresistance, Thin films, Microscopy, ... Features: , 300 Watt Air Cooled Direct ICP Head with four metal sealed mass flow controlled plasma gas inputs, ... Techniques: , ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Thin films, Coating, Semiconductors, ... Features: Compact / Portable, HV, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
Enlitech Image Sensor / Fingerprint-on-Display Testing World's First Commercial CMOS Image Sensor Tester Applications: Photon experiments, Finding new material, Coating, ... Features: Customizable chamber, Compact / Portable, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Liquid crystal, surface analysis, Coating, ... Features: Fast Spectral Detection, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Spectroscopy, Aerospace, surface analysis, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: surface analysis, Nanoscience, Nano-Indentation, ... Features: Compact and easy-to-use, Automation, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution PV Cell Tester Applications: Intermetallics, Photon experiments, Finding new material, ... Features: Imaging, Customizable chamber, ... Techniques: Sensor Tester, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetoresistance, Intermetallics, Thin films, ... Features: Non Destructive, Vibration Stability, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Patterned magnetic media, Patterned magnetic media, Material inspection, ... Features: Magnetic fields, Non Destructive, ... Techniques: , Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Coating, Nanoscience, Quality control of the product, ... Features: Imaging, Low temperature, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Thin films, Catalysis, Microscopy, ... Features: Compact / Portable, Automation, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator High Standard Solar Simulator Applications: Photon experiments, Intermetallics, Spectroscopy, ... Features: Customizable chamber, Compact / Portable, ... Techniques: Solar Simulator, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: Thin films, Thin films, Thin films, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...