Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Thin films, Nanoscience, Optical crystals, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Material inspection, Electrical Characterization, Electronics, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Magnetic properties, Semiconductors, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Thin films, Electrical Characterization, Electronics, ... Features: Vibration Stability, Imaging, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Electron beam, ...
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Arradiance GEMStar XT-P Benchtop Atomic Layer Deposition Applications: Magnetoresistance, Coating, Thin films, ... Features: Pulsed Vapor Push (PVPTM) to handle very low pressure material, Pulsed Vapor Push (PVPTM) to handle very low pressure material, ... Techniques: , ... -
Arradiance GEMStar XT-R Benchtop Atomic Layer Deposition Applications: Thin films, Magnetic properties, Coating, ... Features: , Pulsed Vapor Push (PVPTM) to handle very low pressure material, ... Techniques: , ... -
Arradiance GEMStar XT-S Benchtop Atomic Layer Deposition Applications: Thin films, Magnetoresistance, Microscopy, ... Features: Pulsed Vapor Push (PVPTM) to handle very low pressure material, 300 Watt Air Cooled Direct ICP Head with four metal sealed mass flow controlled plasma gas inputs, ... Techniques: , ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Semiconductors, surface analysis, Nanoscience, ... Features: Excellent temperature uniformity, Compact / Portable, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
Enlitech Image Sensor / Fingerprint-on-Display Testing World's First Commercial CMOS Image Sensor Tester Applications: Electronics, Coating, Electrical Characterization, ... Features: Non Destructive, Customizable chamber, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Optical crystals, surface analysis, Nanoscience, ... Features: Low temperature, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Spectroscopy, Nanoscience, Aerospace, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Semiconductors, Coating, Thin films, ... Features: No External Cooling Requirements, Non Destructive, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution PV Cell Tester Applications: Electronics, Finding new material, Intermetallics, ... Features: Non Destructive, Compact / Portable, ... Techniques: Sensor Tester, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Thin films, Nanoscience, Magnetoresistance, ... Features: Correlative Analysis, Imaging, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Quantum optics, Magnetic properties, Magnetic properties, ... Features: Magnetic fields, Non Destructive, ... Techniques: Microscopy, Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: surface analysis, Liquid crystal, Optical crystals, ... Features: Non Destructive, Flexible System Integration, ... Techniques: , , Spectroscopic ellipsometry, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Coating, surface analysis, Catalysis, ... Features: Compact and easy-to-use, Compact / Portable, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator High Standard Solar Simulator Applications: Electrical Characterization, Finding new material, Photon experiments, ... Features: Customizable chamber, Non Destructive, ... Techniques: Solar Simulator, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , Coating, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...