Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Nanoscience, Spectroscopy, Liquid crystal, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Semiconductors, Electronics, ... Features: Vibration Stability, Imaging, ... Techniques: Microscopy, Scanning Electron Microscopy, Electron beam, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Material inspection, Microscopy, surface analysis, ... Features: Vibration Stability, Non Destructive, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Coating, surface analysis, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Microscopy, Nanopositioners, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Nano-Indentation, Semiconductors, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Electron beam, Professional Scientific and Technical Services, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Electronics, Coating, Thin films, ... Features: Temperature Control, Excellent temperature uniformity, ... Techniques: Sputtering, Physical Vapor Deposition, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Optical crystals, Thin films, Liquid crystal, ... Features: , Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Thin films, Microscopy, surface analysis, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, Finding new material, surface analysis, ... Features: Vibration Stability, Non Destructive, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Nanoscience, Spectroscopy, Magnetoresistance, ... Features: Vacuum, Helium-3 Refrigerator, ... Techniques: Magnetometry, Electrical transport, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, surface analysis, Optical crystals, ... Features: Fast Spectral Detection, Non Destructive, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: Coating, Coating, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...