Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Liquid crystal, Optical crystals, surface analysis, ... Features: Non Destructive, Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Finding new material, Magnetic properties, ... Features: Imaging, Correlative Analysis, ... Techniques: Scanning Electron Microscopy, Electron beam, Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Finding new material, Thin films, Semiconductors, ... Features: Magnetic fields, Vibration Stability, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Patterned magnetic media, Electron Backscatter Diffraction, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Electron beam, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Thin films, Electrical Characterization, ... Features: Correlative Analysis, Imaging, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Atomic Force Microscopy, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Nanoscience, surface analysis, Thin films, ... Features: Customizable chamber, HV, ... Techniques: Sputtering, Physical Vapor Deposition, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Thin films, Quality control of the product, Coating, ... Features: Imaging, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Nanoscience, Thin films, surface analysis, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Intermetallics, Thin films, Magnetoresistance, ... Features: Helium-3 Refrigerator, Helium-3 Refrigerator, ... Techniques: Optical spectroscopy, Magnetometry, Magneto resistance, ... -
Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Coating, Finding new material, surface analysis, ... Features: Magnetic fields, Non Destructive, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Spectroscopy, Thin films, Liquid crystal, ... Features: Imaging, Fast Spectral Detection, ... Techniques: , , Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , Coating, Thin films, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...