Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Optical crystals, Coating, Nanoscience, ... Features: Remote Access, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Microscopy, Thin films, Material inspection, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Atomic Force Microscopy, Nanopositioners, Electron beam, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Microscopy, Thin films, Material inspection, ... Features: Imaging, Non Destructive, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Finding new material, Electron Backscatter Diffraction, ... Features: Correlative Analysis, Imaging, ... Techniques: Scanning Electron Microscopy, Electron beam, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Electrical Characterization, Electronics, ... Features: Imaging, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Nanopositioners, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Coating, Nanoscience, surface analysis, ... Features: Thermal Stability, Compact / Portable, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: surface analysis, Quality control of the product, Nanoscience, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Semiconductors, Nanoscience, Coating, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, surface analysis, Magnetoresistance, ... Features: Magnetic fields, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Electronics, Spectroscopy, Spintronics / magneto-electronics, ... Features: Helium-3 Refrigerator, Cryogen free, ... Techniques: Electrical transport, Quantum random number generation, Quantum cryptography, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Liquid crystal, Thin films, Quality control of the product, ... Features: , Fast Spectral Detection, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , , Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...