Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Nanoscience, Quality control of the product, surface analysis, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nano-Indentation, surface analysis, Nanoscience, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Nanoscience, Material inspection, Thin films, ... Features: Non Destructive, Imaging, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Intermetallics, Finding new material, ... Features: Ultra high sensibility, Imaging, ... Techniques: Nanopositioners, Electron beam, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Spintronics / magneto-electronics, Finding new material, Nanoscience, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Atomic Force Microscopy, Scanning Electron Microscopy, Electron beam, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: surface analysis, Nanoscience, Semiconductors, ... Features: Vacuum, HV, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Optical crystals, Coating, Nanoscience, ... Features: Low temperature, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Microscopy, Coating, Thin films, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Magnetoresistance, Magnetic properties, Quantum optics, ... Features: Cryogen free, Low temperature, ... Techniques: Quantum cryptography, Mossbauer spectroscopy, Electrical transport, ... -
Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, Magnetoresistance, Thin films, ... Features: Correlative Analysis, Magnetic fields, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Optical crystals, Liquid crystal, Coating, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , Thin films, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...