Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Nanoscience, Liquid crystal, surface analysis, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nano-Indentation, Quality control of the product, Patterned magnetic media, ... Features: Imaging, Vibration Stability, ... Techniques: Nanopositioners, Microscopy, Scanning Electron Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Magnetic properties, Patterned magnetic media, Semiconductors, ... Features: Vibration Stability, Imaging, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Semiconductors, Nano-Indentation, ... Features: Vibration Stability, Imaging, ... Techniques: Electron beam, Nanopositioners, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Electron Backscatter Diffraction, Nanoscience, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Microscopy, Scanning Electron Microscopy, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: surface analysis, Coating, Semiconductors, ... Features: HV, Customizable chamber, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Thin films, Nanoscience, Coating, ... Features: , Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: surface analysis, Nanoscience, Thin films, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: surface analysis, Magnetoresistance, Finding new material, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Quantum optics, Semiconductors, Spintronics / magneto-electronics, ... Features: Low temperature, Helium-3 Refrigerator, ... Techniques: Mossbauer spectroscopy, Electrical transport, Optical spectroscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Coating, Spectroscopy, Liquid crystal, ... Features: Non Destructive, Imaging, ... Techniques: , , Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , Thin films, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...