Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Nanoscience, Coating, Spectroscopy, ... Features: Remote Access, Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Quality control of the product, Patterned magnetic media, Finding new material, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Professional Scientific and Technical Services, Microscopy, Electron beam, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Material inspection, Material inspection, Semiconductors, ... Features: Imaging, Vibration Stability, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Semiconductors, surface analysis, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Electron beam, Scanning Electron Microscopy, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Thin films, Electron Backscatter Diffraction, Coating, ... Features: Imaging, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Nanopositioners, Scanning Electron Microscopy, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Semiconductors, Electronics, Thin films, ... Features: Excellent temperature uniformity, HV, ... Techniques: Sputtering, Physical Vapor Deposition, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Optical crystals, Spectroscopy, Thin films, ... Features: Fast Spectral Detection, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Semiconductors, surface analysis, Spectroscopy, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Coating, surface analysis, Nanoscience, ... Features: Non Destructive, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Spintronics / magneto-electronics, Electronics, Spectroscopy, ... Features: Low temperature, Vacuum, ... Techniques: Optical spectroscopy, Magnetometry, Mossbauer spectroscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Liquid crystal, Spectroscopy, ... Features: , Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: Thin films, Coating, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...