Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Quality control of the product, Spectroscopy, Nanoscience, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nano-Indentation, Electron Backscatter Diffraction, Quality control of the product, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Nanopositioners, Electron beam, Professional Scientific and Technical Services, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Magnetic properties, Coating, Coating, ... Features: Vibration Stability, Imaging, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Intermetallics, Nano-Indentation, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Scanning Electron Microscopy, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Patterned magnetic media, Intermetallics, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Electron beam, Scanning Electron Microscopy, Microscopy, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Nanoscience, Thin films, Coating, ... Features: Customizable chamber, Heating option, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Liquid crystal, surface analysis, Coating, ... Features: Imaging, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Aerospace, Nanoscience, Spectroscopy, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetoresistance, Thin films, surface analysis, ... Features: Imaging, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Electronics, Nanoscience, Thin films, ... Features: Low temperature, Magnetic fields, ... Techniques: Optical spectroscopy, Quantum cryptography, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Spectroscopy, Thin films, Quality control of the product, ... Features: Non Destructive, Non Destructive, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , Thin films, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...