Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Coating, Optical crystals, surface analysis, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Spintronics / magneto-electronics, Electronics, Nano-Indentation, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Patterned magnetic media, Finding new material, Nanoscience, ... Features: Imaging, Vibration Stability, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Nano-Indentation, Intermetallics, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Electron beam, Nanopositioners, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Electronics, Electrical Characterization, ... Features: Imaging, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Electron beam, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: surface analysis, Semiconductors, Nanoscience, ... Features: Compact and easy-to-use, Thermal Stability, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Quality control of the product, Coating, Spectroscopy, ... Features: , Imaging, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Thin films, Coating, Aerospace, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Coating, Thin films, Magnetic properties, ... Features: Non Destructive, Imaging, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Aerospace, Spintronics / magneto-electronics, Thin films, ... Features: Cryogen free, Cryogen free, ... Techniques: Quantum cryptography, Electrical transport, Mossbauer spectroscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Quality control of the product, Optical crystals, ... Features: Non Destructive, Non Destructive, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: Coating, Thin films, Thin films, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...