Coating
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Spectroscopy, Coating, Thin films, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electronics, Semiconductors, Electrical Characterization, ... Features: Vibration Stability, Imaging, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Nanoscience, Coating, Microscopy, ... Features: Magnetic fields, Non Destructive, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Thin films, Magnetic properties, ... Features: Imaging, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Intermetallics, Coating, ... Features: Ultra high sensibility, Imaging, ... Techniques: Nanopositioners, Atomic Force Microscopy, Microscopy, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: surface analysis, Nanoscience, Semiconductors, ... Features: Heating option, Excellent temperature uniformity, ... Techniques: Sputtering, Physical Vapor Deposition, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Thin films, Nanoscience, surface analysis, ... Features: Low temperature, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: surface analysis, Nanoscience, Aerospace, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Quantum Design Oxford Quantum Design Oxford Products Applications: Spintronics / magneto-electronics, Thin films, Aerospace, ... Features: , Cryogen free, ... Techniques: Magnetometry, Quantum random number generation, Electrical transport, ... -
Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Coating, Intermetallics, surface analysis, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Nanoscience, Spectroscopy, ... Features: , Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: Coating, Thin films, Thin films, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...