Material inspection
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FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Quality control of the product, Microscopy, Healthcare, ... Features: Compact / Portable, Flexible System Integration, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electron Backscatter Diffraction, Thin films, Material inspection, ... Features: Ultra high sensibility, Imaging, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Material inspection, Electronics, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Microscopy, Electron beam, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Material inspection, Electron Backscatter Diffraction, ... Features: Imaging, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Nanopositioners, Electron beam, ...
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Lake Shore Gaussmeters/Teslameters Ease of Operation and Convenient Integration Applications: Magnetic properties, Material inspection, ... Features: Magnetic fields, ... Techniques: Magnetometry, ... -
Lake Shore Helmholtz and Search Coils High Accuracy and Uniformity Coils Applications: Material inspection, Magnetic properties, ... Features: Magnetic fields, ... Techniques: Magnetometry, ... -
Enlitech Image Sensor / Fingerprint-on-Display Testing World's First Commercial CMOS Image Sensor Tester Applications: Material inspection, Finding new material, Electrical Characterization, ... Features: Imaging, Non Destructive, ... Techniques: Sensor Tester, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Microscopy, Fracture Mechanics, Coating, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution PV Cell Tester Applications: Coating, Electrical Characterization, Intermetallics, ... Features: Customizable chamber, Non Destructive, ... Techniques: Sensor Tester, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Semiconductors, Magnetic properties, Finding new material, ... Features: Magnetic fields, Non Destructive, ... Techniques: , Microscopy, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Intermetallics, Nanoscience, Microscopy, ... Features: Automation, Compact and easy-to-use, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator High Standard Solar Simulator Applications: Finding new material, Intermetallics, Material inspection, ... Features: Non Destructive, Compact / Portable, ... Techniques: Solar Simulator, ...