Nano-Indentation
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electrical Characterization, Patterned magnetic media, Intermetallics, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Electron beam, Scanning Electron Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Magnetic properties, Nanoscience, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Electron beam, Scanning Electron Microscopy, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Electron Backscatter Diffraction, Magnetic properties, ... Features: Ultra high sensibility, Imaging, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Microscopy, ...
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ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Material inspection, Thin films, Microscopy, ... Features: Imaging, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: surface analysis, Microscopy, Material inspection, ... Features: Compact and easy-to-use, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, ...