Nano-Indentation
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Thin films, Material inspection, Nano-Indentation, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Nanopositioners, Electron beam, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Nano-Indentation, surface analysis, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Microscopy, Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Finding new material, Intermetallics, ... Features: Ultra high sensibility, Imaging, ... Techniques: Electron beam, Atomic Force Microscopy, Microscopy, ...
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ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: surface analysis, Nano-Indentation, Coating, ... Features: No External Cooling Requirements, Compact and easy-to-use, ... Techniques: Atomic Force Microscopy, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Catalysis, Fracture Mechanics, Microscopy, ... Features: Compact / Portable, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, ...