Nano-Indentation
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electronics, Patterned magnetic media, Electron Backscatter Diffraction, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Atomic Force Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Nanoscience, Intermetallics, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Patterned magnetic media, Nanoscience, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Electron beam, ...