Quality control of the product
-
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Optical crystals, Quality control of the product, surface analysis, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Healthcare, Material inspection, Microscopy, ... Features: Flexible System Integration, Non Destructive, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Intermetallics, Electron Backscatter Diffraction, Spintronics / magneto-electronics, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Atomic Force Microscopy, Electron beam, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Material inspection, Coating, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Material inspection, Nano-Indentation, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Scanning Electron Microscopy, Electron beam, Atomic Force Microscopy, ...
-
Hirst Magnetics Generation 8 Hirst Pulsed Field Magnetometers (PFM) Magnetic Hysteresis Measurement Applications: Quality control of the product, Magnetic properties, ... Features: Automation, Temperature Control, ... Techniques: Magnetometry, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: surface analysis, Quality control of the product, Spectroscopy, ... Features: Low temperature, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Thin films, Intermetallics, Nanoscience, ... Features: Compact and easy-to-use, Automation, ... Techniques: Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Optical crystals, Coating, Thin films, ... Features: Flexible System Integration, Non Destructive, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Magritek Spinsolve 60 Benchtop NMR Without Any Maintenance Applications: Fluorescence/Phosphorescence lifetime imaging, Spectroscopy, Nuclear magnetic resonance (NMR), ... Features: Magnetic fields, Thermal Stability, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 80 Benchtop NMR Without Any Maintenance Applications: Quality control of the product, Nuclear magnetic resonance (NMR), Spectroscopy, ... Features: Temperature Control, Magnetic fields, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 90 High Performance Benchtop NMR Applications: Nuclear magnetic resonance (NMR), Quality control of the product, Spectroscopy, ... Features: Compact / Portable, No External Cooling Requirements, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Semiconductors, Intermetallics, Quality control of the product, ... Features: Compact / Portable, No External Cooling Requirements, ... Techniques: ...