Quality control of the product
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Coating, Quality control of the product, Liquid crystal, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Microscopy, Material inspection, Healthcare, ... Features: Non Destructive, Compact / Portable, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Intermetallics, Electrical Characterization, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Thin films, Spintronics / magneto-electronics, Nanoscience, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, surface analysis, Semiconductors, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Electron beam, Scanning Electron Microscopy, Professional Scientific and Technical Services, ...
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Hirst Magnetics Generation 8 Hirst Pulsed Field Magnetometers (PFM) Magnetic Hysteresis Measurement Applications: Magnetic properties, Quality control of the product, ... Features: Temperature Control, Automation, ... Techniques: Magnetometry, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Coating, Nanoscience, Optical crystals, ... Features: Wide Spectral Range, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Semiconductors, Catalysis, surface analysis, ... Features: Non Destructive, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Optical crystals, Nanoscience, surface analysis, ... Features: Low temperature, Wide Spectral Range, ... Techniques: , , Spectroscopic ellipsometry, ... -
Magritek Spinsolve 60 Benchtop NMR Without Any Maintenance Applications: Spectroscopy, Quality control of the product, Fluorescence/Phosphorescence lifetime imaging, ... Features: Thermal Stability, Fast Spectral Detection, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 80 Benchtop NMR Without Any Maintenance Applications: Nuclear magnetic resonance (NMR), Quality control of the product, Fluorescence/Phosphorescence lifetime imaging, ... Features: No External Cooling Requirements, Thermal Stability, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 90 High Performance Benchtop NMR Applications: Nuclear magnetic resonance (NMR), Fluorescence/Phosphorescence lifetime imaging, Spectroscopy, ... Features: No External Cooling Requirements, Remote Access, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Semiconductors, Electronics, Intermetallics, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: ...