Quality control of the product
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Liquid crystal, Quality control of the product, Coating, ... Features: Non Destructive, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Magnetic properties, Intermetallics, Electronics, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Electron beam, Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Nano-Indentation, Patterned magnetic media, ... Features: Correlative Analysis, Imaging, ... Techniques: Electron beam, Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Electronics, Finding new material, ... Features: Imaging, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Scanning Electron Microscopy, Nanopositioners, ...
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Hirst Magnetics Generation 8 Hirst Pulsed Field Magnetometers (PFM) Magnetic Hysteresis Measurement Applications: Quality control of the product, Magnetic properties, ... Features: Magnetic fields, Temperature Control, ... Techniques: Magnetometry, ... -
easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: surface analysis, Quality control of the product, Nanoscience, ... Features: X-Ray, XANES, ... Techniques: XFAS, XES, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Nanoscience, Thin films, Quality control of the product, ... Features: Low temperature, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Nanoscience, Optical crystals, Coating, ... Features: Fast Spectral Detection, Flexible System Integration, ... Techniques: , , Spectroscopic ellipsometry, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Catalysis, Spectroscopy, Quality control of the product, ... Features: X-Ray, XANES, ... Techniques: XFAS, XES, ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Quality control of the product, Finding new material, Thin films, ... Features: Compact / Portable, No External Cooling Requirements, ... Techniques: ...