Quality control of the product
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Thin films, Nanoscience, Quality control of the product, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Thin films, Microscopy, Finding new material, ... Features: Imaging, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Microscopy, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Nanoscience, Quality control of the product, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Nanopositioners, Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Thin films, Quality control of the product, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Microscopy, Scanning Electron Microscopy, Atomic Force Microscopy, ...
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Hirst Magnetics Generation 8 Hirst Pulsed Field Magnetometers (PFM) Magnetic Hysteresis Measurement Applications: Quality control of the product, Magnetic properties, ... Features: Temperature Control, Automation, ... Techniques: Magnetometry, ... -
easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Nanoscience, Catalysis, Quality control of the product, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Coating, Optical crystals, Thin films, ... Features: Fast Spectral Detection, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Liquid crystal, Nanoscience, ... Features: Low temperature, Non Destructive, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Magritek Spinsolve 100 High Performance Benchtop NMR Applications: Nuclear magnetic resonance (NMR), Quality control of the product, Spectroscopy, ... Features: Remote Access, Magnetic fields, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 60 Benchtop NMR Without Any Maintenance Applications: Quality control of the product, Spectroscopy, Nuclear magnetic resonance (NMR), ... Features: Thermal Stability, No External Cooling Requirements, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 80 Benchtop NMR Without Any Maintenance Applications: Spectroscopy, Fluorescence/Phosphorescence lifetime imaging, Quality control of the product, ... Features: Compact / Portable, Thermal Stability, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 90 High Performance Benchtop NMR Applications: Spectroscopy, Fluorescence/Phosphorescence lifetime imaging, Nuclear magnetic resonance (NMR), ... Features: Thermal Stability, Compact / Portable, ... Techniques: Nuclear magnetic resonance (NMR), ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Quality control of the product, Fluorescence/Phosphorescence lifetime imaging, Thin films, ... Features: X-Ray, XANES, ... Techniques: XES, XFAS, ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Electronics, Semiconductors, Quality control of the product, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: ...