Quality control of the product
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Spectroscopy, Nanoscience, surface analysis, ... Features: Non Destructive, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Semiconductors, Electrical Characterization, Microscopy, ... Features: Imaging, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Nano-Indentation, Spintronics / magneto-electronics, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Electron beam, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Electrical Characterization, Material inspection, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Atomic Force Microscopy, Electron beam, Scanning Electron Microscopy, ...
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Hirst Magnetics Generation 8 Hirst Pulsed Field Magnetometers (PFM) Magnetic Hysteresis Measurement Applications: Quality control of the product, Magnetic properties, ... Features: Automation, Magnetic fields, ... Techniques: Magnetometry, ... -
easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Spectroscopy, Material inspection, surface analysis, ... Features: XANES, X-Ray, ... Techniques: XES, XFAS, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Optical crystals, Quality control of the product, Coating, ... Features: Low temperature, Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: surface analysis, Quality control of the product, Nanoscience, ... Features: Imaging, Imaging, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Magritek Spinsolve 100 High Performance Benchtop NMR Applications: Nuclear magnetic resonance (NMR), Quality control of the product, Fluorescence/Phosphorescence lifetime imaging, ... Features: Temperature Control, Thermal Stability, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 60 Benchtop NMR Without Any Maintenance Applications: Quality control of the product, Fluorescence/Phosphorescence lifetime imaging, Nuclear magnetic resonance (NMR), ... Features: Temperature Control, No External Cooling Requirements, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 80 Benchtop NMR Without Any Maintenance Applications: Nuclear magnetic resonance (NMR), Fluorescence/Phosphorescence lifetime imaging, Spectroscopy, ... Features: Thermal Stability, Magnetic fields, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 90 High Performance Benchtop NMR Applications: Fluorescence/Phosphorescence lifetime imaging, Quality control of the product, Nuclear magnetic resonance (NMR), ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: Nuclear magnetic resonance (NMR), ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Material inspection, Chemical mapping, Spectroscopy, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Finding new material, Electronics, Semiconductors, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: ...