Quality control of the product
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Spectroscopy, Thin films, Quality control of the product, ... Features: Remote Access, Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Thin films, Electron Backscatter Diffraction, Electrical Characterization, ... Features: Correlative Analysis, Imaging, ... Techniques: Professional Scientific and Technical Services, Electron beam, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Electrical Characterization, Electron Backscatter Diffraction, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Electron beam, Professional Scientific and Technical Services, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Quality control of the product, Material inspection, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Microscopy, Electron beam, Professional Scientific and Technical Services, ...
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Hirst Magnetics Generation 8 Hirst Pulsed Field Magnetometers (PFM) Magnetic Hysteresis Measurement Applications: Quality control of the product, Magnetic properties, ... Features: Magnetic fields, Automation, ... Techniques: Magnetometry, ... -
easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: surface analysis, Quality control of the product, Spectroscopy, ... Features: X-Ray, XANES, ... Techniques: XES, XFAS, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Nanoscience, Liquid crystal, Spectroscopy, ... Features: Flexible System Integration, Imaging, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Spectroscopy, Nanoscience, Liquid crystal, ... Features: Wide Spectral Range, Flexible System Integration, ... Techniques: , , Spectroscopic ellipsometry, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: surface analysis, Thin films, Spectroscopy, ... Features: X-Ray, XANES, ... Techniques: XES, XFAS, ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Electronics, Semiconductors, Thin films, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: ...