Quality control of the product
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J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Coating, Nanoscience, Thin films, ... Features: , Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Even though SEM with higher magnification is used, wet materials need to be dried before inspection since their structure (e.g., cell membranes or cell walls) will be damaged in a vacuum environment. The technical barrier that the sample cannot be observed in its original state still exists. Applications: Quality control of the product, Material inspection, Microscopy, ... Features: Flexible System Integration, Compact / Portable, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
Quantum Design FusionScope FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Applications: Semiconductors, Electron Backscatter Diffraction, surface analysis, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Electron beam, Professional Scientific and Technical Services, Microscopy, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: surface analysis, Quality control of the product, Coating, ... Features: Flexible System Integration, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Nanoscience, Semiconductors, Intermetallics, ... Features: Non Destructive, Automation, ... Techniques: Atomic Force Microscopy, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Thin films, Spectroscopy, surface analysis, ... Features: Wide Spectral Range, Non Destructive, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Magritek Spinsolve 60 Applications: Quality control of the product, Fluorescence/Phosphorescence lifetime imaging, Nuclear magnetic resonance (NMR), ... Features: Remote Access, Fast Spectral Detection, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 80 high performance benchtop NMR spectrometers Applications: Spectroscopy, Nuclear magnetic resonance (NMR), Fluorescence/Phosphorescence lifetime imaging, ... Features: Magnetic fields, Thermal Stability, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 90 Applications: Fluorescence/Phosphorescence lifetime imaging, Spectroscopy, Nuclear magnetic resonance (NMR), ... Features: Remote Access, Magnetic fields, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve Ultra Measure sub-millimolar components dissolved in neat protonated solvents in 8 minutes Applications: Nuclear magnetic resonance (NMR), Fluorescence/Phosphorescence lifetime imaging, Spectroscopy, ... Features: Fast Spectral Detection, No External Cooling Requirements, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Zahner-Elektrik Zennium X The ZENNIUM X is a modular potentiostat / galvanostat including a frequency response analyzer (FRA). The ZENNIUM X potentiostat offers 32 bit DC resolution and 24 bit AC resolution across 12 different current ranges, which enables it to carry out outstandingly precise and accurate measurements. Nine extension slots allow versatile customization of the potentiostat for use in different fields of electrochemistry. Applications: Electronics, Semiconductors, Finding new material, ... Features: Compact / Portable, No External Cooling Requirements, ... Techniques: ...