Quality control of the product
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J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Optical crystals, Thin films, Liquid crystal, ... Features: Non Destructive, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Even though SEM with higher magnification is used, wet materials need to be dried before inspection since their structure (e.g., cell membranes or cell walls) will be damaged in a vacuum environment. The technical barrier that the sample cannot be observed in its original state still exists. Applications: Quality control of the product, Material inspection, Healthcare, ... Features: Non Destructive, Compact / Portable, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
Quantum Design FusionScope FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Applications: Semiconductors, Quality control of the product, Intermetallics, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Microscopy, Scanning Electron Microscopy, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Optical crystals, Thin films, surface analysis, ... Features: Fast Spectral Detection, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Coating, Material inspection, Nanoscience, ... Features: Non Destructive, Imaging, ... Techniques: Atomic Force Microscopy, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: surface analysis, Nanoscience, Optical crystals, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Magritek Spinsolve 60 Applications: Quality control of the product, Nuclear magnetic resonance (NMR), Spectroscopy, ... Features: Remote Access, Fast Spectral Detection, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 80 high performance benchtop NMR spectrometers Applications: Nuclear magnetic resonance (NMR), Fluorescence/Phosphorescence lifetime imaging, Quality control of the product, ... Features: Compact / Portable, Thermal Stability, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve 90 Applications: Quality control of the product, Spectroscopy, Nuclear magnetic resonance (NMR), ... Features: Fast Spectral Detection, Temperature Control, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Magritek Spinsolve Ultra Measure sub-millimolar components dissolved in neat protonated solvents in 8 minutes Applications: Nuclear magnetic resonance (NMR), Spectroscopy, Fluorescence/Phosphorescence lifetime imaging, ... Features: Temperature Control, Compact / Portable, ... Techniques: Nuclear magnetic resonance (NMR), ... -
Zahner-Elektrik Zennium X The ZENNIUM X is a modular potentiostat / galvanostat including a frequency response analyzer (FRA). The ZENNIUM X potentiostat offers 32 bit DC resolution and 24 bit AC resolution across 12 different current ranges, which enables it to carry out outstandingly precise and accurate measurements. Nine extension slots allow versatile customization of the potentiostat for use in different fields of electrochemistry. Applications: Electronics, Thin films, Intermetallics, ... Features: Compact / Portable, No External Cooling Requirements, ... Techniques: ...