Quality control of the product
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Quality control of the product, Liquid crystal, Nanoscience, ... Features: Remote Access, Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: surface analysis, Electronics, Finding new material, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Electron beam, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Electrical Characterization, Electron Backscatter Diffraction, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Electron beam, Microscopy, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Electrical Characterization, Nanoscience, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Microscopy, Electron beam, ...
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Hirst Magnetics Generation 8 Hirst Pulsed Field Magnetometers (PFM) Magnetic Hysteresis Measurement Applications: Magnetic properties, Quality control of the product, ... Features: Automation, Magnetic fields, ... Techniques: Magnetometry, ... -
easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: surface analysis, Spectroscopy, Fluorescence/Phosphorescence lifetime imaging, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Quality control of the product, Nanoscience, Optical crystals, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Nanoscience, surface analysis, ... Features: Low temperature, Wide Spectral Range, ... Techniques: , , Spectroscopic ellipsometry, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Fluorescence/Phosphorescence lifetime imaging, Spectroscopy, surface analysis, ... Features: X-Ray, XANES, ... Techniques: XES, XFAS, ... -
Zahner-Elektrik Zennium X High-End Potentiostat in a Modular and Versatile Platform Applications: Quality control of the product, Electronics, Intermetallics, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: ...