surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Solar Energy, Electronics, surface analysis, ... Features: Magnetic fields, ... Techniques: Magneto resistance, Magnetometry, Electrical transport, ... -
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Semiconductors, Aerospace, Spectroscopy, ... Features: No External Cooling Requirements, Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Optical crystals, Thin films, Nanoscience, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Microscopy, Patterned magnetic media, Nanoscience, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, Electron beam, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Semiconductors, Patterned magnetic media, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Scanning Electron Microscopy, Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Nano-Indentation, Nanoscience, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Electron beam, Nanopositioners, Microscopy, ...
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Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Thin films, Nanoscience, Semiconductors, ... Features: Heating option, Customizable chamber, ... Techniques: Sputtering, Physical Vapor Deposition, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: surface analysis, Quality control of the product, Coating, ... Features: Imaging, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Coating, Nanoscience, Semiconductors, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Semiconductors, surface analysis, Catalysis, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Nanoscience, Magnetic properties, Thin films, ... Features: Magnetic fields, Non Destructive, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Magnetic properties, Magnetic properties, Coating, ... Features: Non Destructive, Imaging, ... Techniques: , Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Coating, Spectroscopy, Quality control of the product, ... Features: , Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Microscopy, Electronics, Nano-Indentation, ... Features: Automation, Compact / Portable, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Janis ST-100 Optical Cryostat Applications: Semiconductors, Intermetallics, Thin films, ... Features: Thermal Stability, Temperature Control, ... Techniques: Optical spectroscopy, Microscopy, Microscopy, ...