Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: surface analysis, Patterned magnetic media, Nanoscience, ...
Features: Imaging, Vibration Stability, ...
Techniques: Nanopositioners, Scanning Electron Microscopy, Atomic Force Microscopy, ...