Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: Thin films, Material inspection, surface analysis, ...
Features: Ultra high sensibility, Imaging, ...
Techniques: Nanopositioners, Scanning Electron Microscopy, Electron beam, ...
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Thin films, Material inspection, surface analysis, ... Features: Ultra high sensibility, Imaging, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Electron beam, ...
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Nano-Indentation, Patterned magnetic media, ... Features: Imaging, Vibration Stability, ... Techniques: Atomic Force Microscopy, Microscopy, Scanning Electron Microscopy, ...