Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: Thin films, Material inspection, surface analysis, ...
Features: Ultra high sensibility, Imaging, ...
Techniques: Nanopositioners, Scanning Electron Microscopy, Electron beam, ...