Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: Patterned magnetic media, Magnetic properties, Nanoscience, ...
Features: Correlative Analysis, Vibration Stability, ...
Techniques: Electron beam, Nanopositioners, Professional Scientific and Technical Services, ...
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Magnetic properties, Nanoscience, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Electron beam, Nanopositioners, Professional Scientific and Technical Services, ...
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Electrical Characterization, Intermetallics, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Microscopy, ...