Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: Microscopy, Patterned magnetic media, Material inspection, ...
Features: SEM Charge-up prevention, Vibration Stability, ...
Techniques: Professional Scientific and Technical Services, Nanopositioners, Microscopy, ...
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Microscopy, Patterned magnetic media, Material inspection, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Microscopy, ...
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Patterned magnetic media, Intermetallics, ... Features: Imaging, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Professional Scientific and Technical Services, ...