Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: Semiconductors, Nanoscience, Material inspection, ...
Features: Imaging, Ultra high sensibility, ...
Techniques: Nanopositioners, Microscopy, Atomic Force Microscopy, ...
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Semiconductors, Nanoscience, Material inspection, ... Features: Imaging, Ultra high sensibility, ... Techniques: Nanopositioners, Microscopy, Atomic Force Microscopy, ...
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Intermetallics, Nano-Indentation, Spintronics / magneto-electronics, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Electron beam, Microscopy, Scanning Electron Microscopy, ...