Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: Nanoscience, Material inspection, Electrical Characterization, ...
Features: Ultra high sensibility, Correlative Analysis, ...
Techniques: Electron beam, Professional Scientific and Technical Services, Atomic Force Microscopy, ...
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nanoscience, Material inspection, Electrical Characterization, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Electron beam, Professional Scientific and Technical Services, Atomic Force Microscopy, ...
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Material inspection, Thin films, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Professional Scientific and Technical Services, Microscopy, Nanopositioners, ...