Quantum Design Microscopy
Atomic Force Microscope for SEM/FIB
The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows.
This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ...
Applications: Spintronics / magneto-electronics, Electrical Characterization, Material inspection, ...
Features: Imaging, Ultra high sensibility, ...
Techniques: Microscopy, Nanopositioners, Electron beam, ...
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Spintronics / magneto-electronics, Electrical Characterization, Material inspection, ... Features: Imaging, Ultra high sensibility, ... Techniques: Microscopy, Nanopositioners, Electron beam, ...
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, surface analysis, Finding new material, ... Features: Correlative Analysis, Imaging, ... Techniques: Scanning Electron Microscopy, Electron beam, Atomic Force Microscopy, ...