Correlative Analysis
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Microscopy, Spintronics / magneto-electronics, Semiconductors, ... Features: Imaging, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Microscopy, Electron beam, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Electron Backscatter Diffraction, Semiconductors, ... Features: Ultra high sensibility, Imaging, ... Techniques: Electron beam, Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Electrical Characterization, Nano-Indentation, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Professional Scientific and Technical Services, Scanning Electron Microscopy, Atomic Force Microscopy, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Thin films, Nanoscience, Magnetic properties, ... Features: Ultra high sensibility, Non Destructive, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ...