Correlative Analysis
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Finding new material, Microscopy, Spintronics / magneto-electronics, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Electron beam, Scanning Electron Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Nano-Indentation, Magnetic properties, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Electrical Characterization, Coating, ... Features: Ultra high sensibility, Imaging, ... Techniques: Microscopy, Nanopositioners, Atomic Force Microscopy, ...
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Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Nanoscience, Magnetic properties, Patterned magnetic media, ... Features: Imaging, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...