Correlative Analysis
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Magnetic properties, Electrical Characterization, Electron Backscatter Diffraction, ... Features: Imaging, Ultra high sensibility, ... Techniques: Nanopositioners, Electron beam, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Microscopy, Magnetic properties, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Electron beam, Professional Scientific and Technical Services, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Magnetic properties, Electron Backscatter Diffraction, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Electron beam, Scanning Electron Microscopy, Professional Scientific and Technical Services, ...
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Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Patterned magnetic media, Nanoscience, surface analysis, ... Features: Non Destructive, Imaging, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...