Correlative Analysis
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Thin films, Magnetic properties, Electrical Characterization, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Quality control of the product, Finding new material, ... Features: Vibration Stability, Imaging, ... Techniques: Atomic Force Microscopy, Nanopositioners, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, surface analysis, Semiconductors, ... Features: Imaging, Correlative Analysis, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Atomic Force Microscopy, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, surface analysis, Finding new material, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...