Correlative Analysis
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Spintronics / magneto-electronics, Intermetallics, Microscopy, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Nanoscience, Thin films, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Electron beam, Scanning Electron Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Coating, Nano-Indentation, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Scanning Electron Microscopy, Microscopy, ...
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Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetoresistance, Coating, Thin films, ... Features: Imaging, Vibration Stability, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...