Imaging
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: surface analysis, Aerospace, Semiconductors, ... Features: Automation, Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: surface analysis, Nanoscience, Material inspection, ... Features: Imaging, Correlative Analysis, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Patterned magnetic media, Nanoscience, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Patterned magnetic media, Intermetallics, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Electron beam, Atomic Force Microscopy, Scanning Electron Microscopy, ...
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Enlitech Image Sensor / Fingerprint-on-Display Testing World's First Commercial CMOS Image Sensor Tester Applications: Coating, Electrical Characterization, Finding new material, ... Features: Imaging, Customizable chamber, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Spectroscopy, Nanoscience, surface analysis, ... Features: Non Destructive, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Spectroscopy, surface analysis, Microscopy, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Semiconductors, Microscopy, Coating, ... Features: Compact and easy-to-use, Compact / Portable, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution PV Cell Tester Applications: Electronics, Intermetallics, Coating, ... Features: Imaging, Customizable chamber, ... Techniques: Sensor Tester, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Intermetallics, Finding new material, Magnetoresistance, ... Features: Magnetic fields, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Patterned magnetic media, Magnetic properties, Coating, ... Features: Magnetic fields, Imaging, ... Techniques: , Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Quality control of the product, Thin films, Spectroscopy, ... Features: , Non Destructive, ... Techniques: , , Spectroscopic ellipsometry, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator High Standard Solar Simulator Applications: Material inspection, Spectroscopy, Electronics, ... Features: Compact / Portable, Imaging, ... Techniques: Solar Simulator, ...