Imaging
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: surface analysis, Electronics, Thin films, ... Features: No External Cooling Requirements, Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Thin films, Patterned magnetic media, Quality control of the product, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Nanopositioners, Atomic Force Microscopy, Electron beam, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Material inspection, Nano-Indentation, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Nanopositioners, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Thin films, surface analysis, Electronics, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Microscopy, Atomic Force Microscopy, Nanopositioners, ...
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Enlitech Image Sensor / Fingerprint-on-Display Testing World's First Commercial CMOS Image Sensor Tester Applications: Electrical Characterization, Finding new material, Electronics, ... Features: Customizable chamber, Compact / Portable, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Coating, surface analysis, Thin films, ... Features: Fast Spectral Detection, Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Coating, Microscopy, Semiconductors, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Catalysis, Fracture Mechanics, Material inspection, ... Features: Non Destructive, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution PV Cell Tester Applications: Finding new material, Electronics, Coating, ... Features: Non Destructive, Imaging, ... Techniques: Sensor Tester, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetoresistance, Patterned magnetic media, Spintronics / magneto-electronics, ... Features: Magnetic fields, Non Destructive, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Magnetic properties, surface analysis, Nanoscience, ... Features: Vibration Stability, Non Destructive, ... Techniques: , Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Spectroscopy, Quality control of the product, surface analysis, ... Features: Low temperature, Fast Spectral Detection, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator High Standard Solar Simulator Applications: Intermetallics, Electronics, Spectroscopy, ... Features: Compact / Portable, Customizable chamber, ... Techniques: Solar Simulator, ...