SEM Charge-up prevention
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electrical Characterization, surface analysis, Material inspection, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Nanopositioners, Microscopy, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Nano-Indentation, Material inspection, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Nanopositioners, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Intermetallics, Spintronics / magneto-electronics, Finding new material, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Electron beam, ...