SEM Charge-up prevention
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Finding new material, Nano-Indentation, Quality control of the product, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Electron beam, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Coating, Finding new material, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Magnetic properties, Semiconductors, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Electron beam, ...