SEM Charge-up prevention
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Microscopy, Electron Backscatter Diffraction, Coating, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Atomic Force Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Microscopy, Quality control of the product, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Microscopy, Electron beam, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, surface analysis, Patterned magnetic media, ... Features: Vibration Stability, Imaging, ... Techniques: Scanning Electron Microscopy, Microscopy, Electron beam, ...