SEM Charge-up prevention
-
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electronics, Electrical Characterization, Nanoscience, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Intermetallics, Semiconductors, Finding new material, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Quality control of the product, Nanoscience, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Professional Scientific and Technical Services, Scanning Electron Microscopy, Atomic Force Microscopy, ...