SEM Charge-up prevention
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Quality control of the product, Electron Backscatter Diffraction, Microscopy, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Electron beam, Nanopositioners, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Intermetallics, Magnetic properties, ... Features: Ultra high sensibility, Imaging, ... Techniques: Electron beam, Nanopositioners, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Coating, Nano-Indentation, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Microscopy, ...