Ultra high sensibility
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electron Backscatter Diffraction, Intermetallics, Finding new material, ... Features: Correlative Analysis, Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, Electron beam, ... -
Quantum Design Closed-Cycle Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Microscopy, Spintronics / magneto-electronics, Spectroscopy, ... Features: Thermal Stability, Non Destructive, ... Techniques: Microscopy, Optical spectroscopy, Magneto resistance, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Patterned magnetic media, Quality control of the product, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Microscopy, Scanning Electron Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Semiconductors, Electron Backscatter Diffraction, ... Features: Correlative Analysis, Imaging, ... Techniques: Microscopy, Scanning Electron Microscopy, Atomic Force Microscopy, ...
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Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, Spintronics / magneto-electronics, Finding new material, ... Features: Imaging, Non Destructive, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...