Ultra high sensibility
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: surface analysis, Electron Backscatter Diffraction, Patterned magnetic media, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Microscopy, Atomic Force Microscopy, Electron beam, ... -
Quantum Design Closed-Cycle Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Magnetic properties, Microscopy, Semiconductors, ... Features: Low temperature, Temperature Control, ... Techniques: Magneto resistance, Optical spectroscopy, Magnetometry, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Quality control of the product, Nano-Indentation, Nanoscience, ... Features: Imaging, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Magnetic properties, Quality control of the product, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Electron beam, Nanopositioners, Professional Scientific and Technical Services, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, Intermetallics, Nanoscience, ... Features: Vibration Stability, Non Destructive, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...