Ultra high sensibility
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Finding new material, Magnetic properties, Microscopy, ... Features: Ultra high sensibility, Imaging, ... Techniques: Electron beam, Microscopy, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Finding new material, Electron Backscatter Diffraction, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Nanopositioners, Electron beam, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Thin films, Quality control of the product, Semiconductors, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Microscopy, ...
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Quantum Design OptiCool - 7 Tesla Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Spintronics / magneto-electronics, Photon experiments, Magnetic properties, ... Features: Vibration Stability, Cryogen free, ... Techniques: Microscopy, Optical spectroscopy, Magnetometry, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Spintronics / magneto-electronics, Magnetic properties, Magnetoresistance, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ...