Ultra high sensibility
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Thin films, Intermetallics, Finding new material, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Electron beam, Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Design Closed-Cycle Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Spectroscopy, Semiconductors, Microscopy, ... Features: Non Destructive, Temperature Control, ... Techniques: Optical spectroscopy, Magnetometry, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Quality control of the product, Coating, Electrical Characterization, ... Features: Vibration Stability, Imaging, ... Techniques: Microscopy, Nanopositioners, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Nanoscience, Magnetic properties, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Electron beam, Nanopositioners, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Nanoscience, Finding new material, Thin films, ... Features: Imaging, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...