Hospitals
-
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Spintronics / magneto-electronics, Electron Backscatter Diffraction, Intermetallics, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Professional Scientific and Technical Services, Scanning Electron Microscopy, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Coating, Magnetic properties, ... Features: Imaging, Correlative Analysis, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Magnetic properties, Coating, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Electron beam, Nanopositioners, Scanning Electron Microscopy, ...