Hospitals
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nano-Indentation, Intermetallics, Thin films, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Material inspection, Intermetallics, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Electron beam, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nanoscience, Finding new material, Microscopy, ... Features: Vibration Stability, Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, Scanning Electron Microscopy, ...