Mining, Quarrying, and Oil and Gas Extraction
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FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Quality control of the product, Microscopy, Material inspection, ... Features: Flexible System Integration, Non Destructive, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Intermetallics, Material inspection, Spintronics / magneto-electronics, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Electron beam, Nanopositioners, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Microscopy, Patterned magnetic media, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Electron beam, Atomic Force Microscopy, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Semiconductors, surface analysis, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Atomic Force Microscopy, ...