Mining, Quarrying, and Oil and Gas Extraction
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FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Material inspection, Healthcare, Microscopy, ... Features: Flexible System Integration, Non Destructive, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Intermetallics, Finding new material, Spintronics / magneto-electronics, ... Features: Imaging, Vibration Stability, ... Techniques: Nanopositioners, Electron beam, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Finding new material, Nanoscience, ... Features: Correlative Analysis, Imaging, ... Techniques: Nanopositioners, Electron beam, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Quality control of the product, Patterned magnetic media, Intermetallics, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Nanopositioners, Atomic Force Microscopy, Scanning Electron Microscopy, ...