Mining, Quarrying, and Oil and Gas Extraction
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Electron Backscatter Diffraction, Nanoscience, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Scanning Electron Microscopy, Electron beam, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, surface analysis, Patterned magnetic media, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Atomic Force Microscopy, Electron beam, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Nano-Indentation, Electronics, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Microscopy, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Fluorescence/Phosphorescence lifetime imaging, Quality control of the product, Catalysis, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Material inspection, Spectroscopy, Chemical mapping, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ...