Mining, Quarrying, and Oil and Gas Extraction
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Finding new material, surface analysis, Electron Backscatter Diffraction, ... Features: Imaging, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Microscopy, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Electrical Characterization, Magnetic properties, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Atomic Force Microscopy, Electron beam, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Coating, Magnetic properties, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Electron beam, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Fluorescence/Phosphorescence lifetime imaging, Catalysis, Spectroscopy, ... Features: XANES, X-Ray, ... Techniques: XES, XFAS, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Fluorescence/Phosphorescence lifetime imaging, Material inspection, Thin films, ... Features: X-Ray, XANES, ... Techniques: XFAS, XES, ...