Mining, Quarrying, and Oil and Gas Extraction
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Spintronics / magneto-electronics, Material inspection, Magnetic properties, ... Features: Vibration Stability, Imaging, ... Techniques: Microscopy, Scanning Electron Microscopy, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Electron Backscatter Diffraction, Microscopy, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Microscopy, Nanopositioners, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Quality control of the product, Intermetallics, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Microscopy, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: surface analysis, Catalysis, Material inspection, ... Features: X-Ray, XANES, ... Techniques: XFAS, XES, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Fluorescence/Phosphorescence lifetime imaging, Quality control of the product, surface analysis, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ...