Mining, Quarrying, and Oil and Gas Extraction
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Magnetic properties, Electron Backscatter Diffraction, Electrical Characterization, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Electron beam, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Electronics, Magnetic properties, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Scanning Electron Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Microscopy, Semiconductors, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Microscopy, Scanning Electron Microscopy, Professional Scientific and Technical Services, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Catalysis, Nanoscience, surface analysis, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Nanoscience, Thin films, Chemical mapping, ... Features: X-Ray, XANES, ... Techniques: XES, XFAS, ...