Mining, Quarrying, and Oil and Gas Extraction
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electrical Characterization, Electronics, Thin films, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Microscopy, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Nanoscience, Finding new material, ... Features: Ultra high sensibility, Imaging, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Electron Backscatter Diffraction, Electrical Characterization, ... Features: Imaging, Correlative Analysis, ... Techniques: Nanopositioners, Microscopy, Electron beam, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Nanoscience, Quality control of the product, surface analysis, ... Features: XANES, X-Ray, ... Techniques: XES, XFAS, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: surface analysis, Catalysis, Fluorescence/Phosphorescence lifetime imaging, ... Features: X-Ray, XANES, ... Techniques: XES, XFAS, ...