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PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution
Enlitech
QE-R quantum efficiency system is a PV cell tester which can provide cell’s EQE. IPCE, IQE and spectral response data accurately and rapidly. The quantum efficiency information provided by QE-R quantum efficiency system is commonly used by PV researchers to illustrate and study the device design, device performance, process improving, material bandgap, impurity or trap.Due to its high repeatability and accuracy of QE-R quantum efficiency system, metrology engineers also use QE-R quantum efficiency system to do spectral mismatch calculation and the uncertainty evaluation of PV conversion efficiency. QE-R quantum efficiency system is adopted by over 500 outstanding PV research laboratories and published over 1,000 SCI papers in the past 10 years, including many flag-ship journals like Nature, Science, Joule, and Advanced Materials et al.
QE-RX is a PV cell efficiency-loss analyzer for the high efficiency solar cell research and development. Since 2015, the loss mechanism is the key information for improving the conversion efficiency of PERC, HJT, TOP-Con and other highly efficient solar cells. The conversion efficiency loss can be attributed to three factors, including short-circuit current density (Jsc), open-circuit voltage (Voc), and fill-factor (FF) losses. QE-RX can not only measure the PV-EQE, Reflectance and PV-IQE data but also analyze Jsc, Voc, and FF losses by combining the analyzing software SQ-JVFLA. Enlitech integrates three different testing functions within QE-RX and develops SQ-JVFLA software helping users analyze three different losses by using Shockley-Queisser thermal limit theory. QE-RX is your best partner for boosting the PV efficiency.
Features
• For PESC, PERC, PERL, HJT, back-contact, bi-facial and TOP-Con Si solar cells• Provide the data in QE (quantum efficiency), PV-EQE (external quantum efficiency), IPCE (incident photon-to-electron conversion efficiency), SR (spectral response), IQE (internal quantum efficiency), and Reflectance.
• Compact and High Repeatability over 99.5%
• wavelength range: 300~1200 nm
• Jsc Loss Analysis and report (with SQ-JVFLA software)
• Voc Loss Analysis and report (with SQ-JVFLA software)
• FF Loss Analysis and report (with SQ-JVFLA software)
• Exclusive EQE uncertainty evaluation report and quality control accredited by ISO/IEC 17025 for journal paper submission.
• Variety and customized sample test fixtures.
| Model | QE-R |
|---|---|
| Lamp Wavelength Range | 250nm~2500nm |
| Measuring Wavelength Range | 300nm~1100nm 300nm~1800nm 300nm~2500nm |
| Un-Repeatability | ≦ 0.3%; 300nm~400nm ≦ 0.2%; 400nm~1000nm ≦ 0.3%; 1000nm~1100nm |
| Jsc Un-Repeatability | ≦ 0.1% |
| Jsc Uncertainty | ≦ 0.2% |
| Light Instability (long time) | ≦ 0.2% (3hr) |
| Beam Spot Area | 1 x 1 mm2 |
| Beam Incident Angle | 8° |
| Effective Working Distance | > 10 cm |
| DSP Lock-in Amplifier | a. Two sets of dual-phase lock-in amplifiers b. < 25 us; Max acquisition speed c. <1 us; delay time between two channels c. RXYθ e. 107; Gain f. 10 V; Max input volateg g. Noise filters h. 4-channel multiplexer for signal switching |
| Light Intensity Monitor | a. 1 monitoring cell; b. for light intensity measuring simultaneously |
| Software | a. Absolute light intensity calibration b. SR, EQE measuring c. Auto in-situ Jsc(EQE) calculation d. Auto Jsc(EQE) calculation at each wavelength e. IQE calculation f. Bandgap analysis g. Data collecting and analyzing h. Mismatch factor (MMF) calculation i. Signal monitoring function j. txt data format |
| Signal Oscilloscope | a. Oscilloscope display b. Time-domain and frequency-domain analyzing capability c. Signal monitoring function; photo-current signal monitoring on DUT |
| Functions | IPCE EQE SR IQE (option) Reflectance (option) |
| Dark box | 600mm x 600mm x 600mm |
Applications
• PERC/ HJT/ TOP-Con PV Solar Cell Efficiency-Loss Analysis• IEC-60904-8 Spectral Response measurement
• IEC-60904-7 Mismatch Factor calculation
• IEC-60904-1 MMF Correction
• Si solar cell processing quality control
• Si solar cell bandgap determination
• Perovskite Solar Cell (PSC) Test
• Organic Solar Cell (OSC, OPV) Test
• Tandem/Multi-junction Solar Cell Test
• Solar cell characterization
• Bulk-Heterojunction phase separation study
• Mismatch Factor (MMF) calculation
• Short-circuit current density under AM spectrum Jsc(QE)
• Processing control
