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Redux AFM

ICSPI

After nearly 10 years of research and development at the University of Waterloo, Canada, with funding from DARPA and the Ontario Research Fund, ICSPI commercialized the world’s first single-chip atomic force microscope (AFM).

Their products have reset the expectations for AFM and nanoscale metrology: all of the scanners and sensors have been integrated onto a single 1 mm x 1 mm CMOS chip, miniaturizing the size and dramatically simplifying the operation of nanoscale metrology instruments.

A higher level of automation

Motorized XY and Z stages for easy sample positioning
Integrated optical microscope
One-click automatic approach in seconds
Laserless AFM system — no laser alignment
Collect topography, phase images, film thickness, roughness, particle size and more on your benchtop

The fastest time to data for benchtop AFM

Go from sample loading to data in two minutes (256 x 256 pixel scan)
Automatic frequency sweep, automatic approach and fast scanning

Ultra-durable probes with 1000+ scan lifetime

Ultra-durable materials: diamond-like carbon (DLC)
Ultra-low tapping force: no sample damage and compatible with soft samples such as elastomers
No more tedious silicon tip changes: simple AFM tip cartridge changes after 1,000+ scans
The only AFM with an easy-to-use tip cartridge

Specifications

AFM Specifications
Max scan area (XY)	20 ?m x 20 ?m
Z Range	10 ?m
Scan speed	80 seconds (256 x 256 pixel, 20 ?m x 20 ?m)
Noise floor	<0.5 nm rms
XY Scanner resolution	<0.5 nm
Samples
Sample platform size	105 mm x 95 mm
Max sample height	20 mm
Max sample weight	250 g
Sample condition	Dry
Motorized XY Stage
Sample positioning range (XY)	10 mm x 10 mm
Integrated Optical Microscope
Objective	10x, 0.25 NA
Field of view	1.4 mm x 0.8 mm
Resolution	1920 x 1080 FHD video output
Sample illumination	Integrated LED lighting
System Dimensions
Dimensions (L x W x H)	23.2 cm x 22.0 cm x 24.6 cm
Weight	4 kg
Software and I/O
Communication	USB
Operating System	Windows 10, 11
Data output	tsv, gsf, png
Power
Power supply	Class II (two prong)
Input	100-240 VAC ~ 50/60 Hz
Output	12 VDC, 3 A

Applications

Polymers and Composites
Collect nanoscale topography data of polymers, co-polymers and composites with extremely high spatial resolution.

Microfabrication
Thin-film and structure characterization in 3D at the nanoscale.

Metals and Minerals
Determine surface finish, investigate morphology and characterize grain structure.

Film Thickness, Step Heights and Coatings
Quickly measure film thickness and step heights of thin films, coatings, gratings and more, with extremely high resolution.