Atomic Force Microscopy
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Electronics, Semiconductors, Thin films, ... Features: No External Cooling Requirements, Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Magnetic properties, Quality control of the product, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Electron beam, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Nanoscience, Patterned magnetic media, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Atomic Force Microscopy, Electron beam, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Thin films, surface analysis, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Nanopositioners, Electron beam, Atomic Force Microscopy, ...
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CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Coating, Microscopy, Thin films, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Thin films, surface analysis, Microscopy, ... Features: Non Destructive, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Thin films, Intermetallics, Finding new material, ... Features: Magnetic fields, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
ICSPI Redux AFM Motorized Topography in a Benchtop Device Applications: Thin films, Nano-Indentation, Coating, ... Features: Compact / Portable, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, ...