Atomic Force Microscopy
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Aerospace, Semiconductors, Electronics, ... Features: Imaging, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Semiconductors, Electrical Characterization, Electronics, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Microscopy, Nanopositioners, Electron beam, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Magnetic properties, Quality control of the product, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Microscopy, Electron beam, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Patterned magnetic media, Electron Backscatter Diffraction, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Atomic Force Microscopy, Microscopy, Electron beam, ...
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CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Nanoscience, Aerospace, Spectroscopy, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetoresistance, Thin films, surface analysis, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ...