Atomic Force Microscopy
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GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Finding new material, Intermetallics, surface analysis, ... Features: Compact / Portable, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Microscopy, ...
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icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Semiconductors, Thin films, Catalysis, ... Features: Imaging, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, ...