Atomic Force Microscopy
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Spectroscopy, Electronics, surface analysis, ... Features: Automation, Non Destructive, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Microscopy, Electrical Characterization, Thin films, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Electron beam, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Quality control of the product, Material inspection, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Microscopy, Nanopositioners, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Intermetallics, Quality control of the product, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Electron beam, ...
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CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Thin films, Coating, Microscopy, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: surface analysis, Thin films, Finding new material, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...