Atomic Force Microscopy
-
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Finding new material, Intermetallics, surface analysis, ... Features: Compact / Portable, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Microscopy, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Semiconductors, Thin films, Catalysis, ... Features: Imaging, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, ...