Atomic Force Microscopy
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CS Instruments AFM Galaxy Dual Controller The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software. Applications: surface analysis, Thin films, Electronics, ... Features: No External Cooling Requirements, Non Destructive, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Intermetallics, Thin films, Chemical mapping, ... Features: Vibration Stability, Non Destructive, ... Techniques: Atomic Force Microscopy, Scanning Electron Microscopy, Microscopy, ... -
CS Instruments Nano-Observer AFM The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. Applications: Semiconductors, Thin films, Coating, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Catalysis, Thin films, surface analysis, ... Features: Non Destructive, Imaging, ... Techniques: Atomic Force Microscopy, ...