Atomic Force Microscopy
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Electronics, Semiconductors, surface analysis, ... Features: Non Destructive, Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Semiconductors, Electron Backscatter Diffraction, Nano-Indentation, ... Features: Vibration Stability, Imaging, ... Techniques: Professional Scientific and Technical Services, Electron beam, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nanoscience, surface analysis, Electrical Characterization, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Nanopositioners, Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Coating, Quality control of the product, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Nanopositioners, ...
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CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: surface analysis, Coating, Spectroscopy, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Patterned magnetic media, Nanoscience, surface analysis, ... Features: Imaging, Non Destructive, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ...