Nanopositioners
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electrical Characterization, Coating, Magnetic properties, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Electron beam, Professional Scientific and Technical Services, ... -
Montana Instruments CryoAdvance High Mechanical and Thermal Stability from 3.6 to 300 k Applications: Thin films, Photon experiments, Semiconductors, ... Features: Cryogen free, Compact and easy-to-use, ... Techniques: Magneto-Optic Kerr Effect (MOKE), Optical spectroscopy, Mossbauer spectroscopy, ... -
Montana Instruments Cryostation® s200 Versatile Optical Cryostat For a Wide Range of Experiments Applications: Photon experiments, Semiconductors, Optical crystals, ... Features: Low temperature, Cooling System, ... Techniques: Nanopositioners, Magneto-Optic Kerr Effect (MOKE), Mossbauer spectroscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Electron Backscatter Diffraction, Finding new material, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Electron beam, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Quality control of the product, Electron Backscatter Diffraction, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Microscopy, ...