Nanopositioners
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Finding new material, Nano-Indentation, Electron Backscatter Diffraction, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Microscopy, Nanopositioners, Electron beam, ... -
Montana Instruments CryoAdvance High Mechanical and Thermal Stability from 3.6 to 300 k Applications: Thin films, Optical crystals, Spectroscopy, ... Features: Cryogen free, Customizable chamber, ... Techniques: Mossbauer spectroscopy, Optical spectroscopy, Magneto-Optic Kerr Effect (MOKE), ... -
Montana Instruments Cryostation® s200 Versatile Optical Cryostat For a Wide Range of Experiments Applications: Optical crystals, Semiconductors, Spectroscopy, ... Features: Wave Guides, Customizable chamber, ... Techniques: Nanopositioners, Magneto-Optic Kerr Effect (MOKE), Optical spectroscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: surface analysis, Quality control of the product, Thin films, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Microscopy, Atomic Force Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Material inspection, Thin films, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Microscopy, Atomic Force Microscopy, Professional Scientific and Technical Services, ...