Professional Scientific and Technical Services
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electron Backscatter Diffraction, Thin films, Quality control of the product, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Patterned magnetic media, Quality control of the product, ... Features: Ultra high sensibility, Imaging, ... Techniques: Professional Scientific and Technical Services, Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Microscopy, Magnetic properties, ... Features: Correlative Analysis, Imaging, ... Techniques: Electron beam, Nanopositioners, Microscopy, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Intermetallics, Spintronics / magneto-electronics, Thin films, ... Features: Vibration Stability, Imaging, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Mutech Microsystems µAligner Compact Mask Aligner for Microfabrication Applications: Spintronics / magneto-electronics, Semiconductors, Patterned magnetic media, ... Features: Stand-Alone Design, Remote Access, ... Techniques: Air Transportation, Professional Scientific and Technical Services, Computer and Electronic Product Manufacturing, ...