Professional Scientific and Technical Services
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electron Backscatter Diffraction, Electronics, Nano-Indentation, ... Features: Correlative Analysis, Imaging, ... Techniques: Atomic Force Microscopy, Nanopositioners, Electron beam, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Quality control of the product, surface analysis, Semiconductors, ... Features: Ultra high sensibility, Imaging, ... Techniques: Microscopy, Nanopositioners, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Nanoscience, Nano-Indentation, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Electron beam, Atomic Force Microscopy, ...
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Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Spintronics / magneto-electronics, Magnetic properties, Magnetoresistance, ... Features: Non Destructive, Vibration Stability, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Mutech Microsystems µAligner Compact Mask Aligner for Microfabrication Applications: Electronics, Patterned magnetic media, Semiconductors, ... Features: Compact and easy-to-use, Stand-Alone Design, ... Techniques: Professional Scientific and Technical Services, Computer and Electronic Product Manufacturing, Air Transportation, ...