Scanning Electron Microscopy
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FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Healthcare, Microscopy, Quality control of the product, ... Features: Compact / Portable, Flexible System Integration, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nanoscience, Nano-Indentation, Electron Backscatter Diffraction, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Professional Scientific and Technical Services, Electron beam, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electrical Characterization, Quality control of the product, Nano-Indentation, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Electron beam, Scanning Electron Microscopy, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nanoscience, Spintronics / magneto-electronics, Semiconductors, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Atomic Force Microscopy, Microscopy, Professional Scientific and Technical Services, ...