Scanning Electron Microscopy
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FlowVIEW Aquarius Kit for Liquid and Moist Samples Analysis in SEM Applications: Quality control of the product, Material inspection, Healthcare, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Coating, Nano-Indentation, Quality control of the product, ... Features: Vibration Stability, SEM Charge-up prevention, ... Techniques: Electron beam, Microscopy, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Finding new material, Spintronics / magneto-electronics, Patterned magnetic media, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Scanning Electron Microscopy, Microscopy, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Quality control of the product, Coating, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Nanopositioners, ...