Scanning Electron Microscopy
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Finding new material, Electronics, Electrical Characterization, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Electron beam, Nanopositioners, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Electron Backscatter Diffraction, Nanoscience, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Patterned magnetic media, Finding new material, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Microscopy, Professional Scientific and Technical Services, Atomic Force Microscopy, ...