Scanning Electron Microscopy
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electronics, Electron Backscatter Diffraction, Material inspection, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, surface analysis, Material inspection, ... Features: Ultra high sensibility, Imaging, ... Techniques: Professional Scientific and Technical Services, Electron beam, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Magnetic properties, Intermetallics, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Electron beam, Microscopy, Atomic Force Microscopy, ...