Scanning Electron Microscopy
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Magnetic properties, surface analysis, Quality control of the product, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Electron beam, Microscopy, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Spintronics / magneto-electronics, Microscopy, Magnetic properties, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Electron beam, Nanopositioners, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Electrical Characterization, Electronics, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Electron beam, ...