Scanning Electron Microscopy
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Coating, Material inspection, Electronics, ... Features: Imaging, Vibration Stability, ... Techniques: Microscopy, Professional Scientific and Technical Services, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Finding new material, Microscopy, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Electron beam, Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Intermetallics, Magnetic properties, Thin films, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Microscopy, Nanopositioners, ...