J.A. Woollam
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Liquid crystal, Quality control of the product, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: surface analysis, Thin films, Nanoscience, ... Features: Flexible System Integration, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Nanoscience, surface analysis, Quality control of the product, ... Features: , Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: Coating, Coating, Thin films, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...