Electron beam
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Semiconductors, Thin films, Material inspection, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Microscopy, Scanning Electron Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Magnetic properties, Intermetallics, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Electron beam, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electron Backscatter Diffraction, Spintronics / magneto-electronics, Nano-Indentation, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Nanopositioners, Atomic Force Microscopy, Scanning Electron Microscopy, ...