surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Nanoscience, Electronics, Magnetic properties, ... Features: Magnetic fields, ... Techniques: Electrical transport, Magneto resistance, AC Susceptibility, ... -
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Electronics, Aerospace, Thin films, ... Features: No External Cooling Requirements, Non Destructive, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Optical crystals, Nanoscience, Spectroscopy, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Semiconductors, Magnetic properties, Nano-Indentation, ... Features: Imaging, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, Electron beam, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Nanoscience, Thin films, Patterned magnetic media, ... Features: Non Destructive, Imaging, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Thin films, Coating, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Nanopositioners, Atomic Force Microscopy, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Thin films, surface analysis, Microscopy, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Electron beam, Scanning Electron Microscopy, Nanopositioners, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Catalysis, Material inspection, Thin films, ... Features: X-Ray, XANES, ... Techniques: XES, XFAS, ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Thin films, Electronics, Semiconductors, ... Features: Thermal Stability, Customizable chamber, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Thin films, surface analysis, Quality control of the product, ... Features: Wide Spectral Range, Imaging, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Semiconductors, Microscopy, Coating, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, Patterned magnetic media, Nanoscience, ... Features: Correlative Analysis, Imaging, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: surface analysis, Coating, Liquid crystal, ... Features: Flexible System Integration, Fast Spectral Detection, ... Techniques: , , Spectroscopic ellipsometry, ... -
Lake Shore ST-100 Optical Cryostat Applications: Semiconductors, surface analysis, Thin films, ... Features: Thermal Stability, Temperature Control, ... Techniques: , Optical spectroscopy, Microscopy, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Spectroscopy, Catalysis, Material inspection, ... Features: XANES, X-Ray, ... Techniques: XES, XFAS, ...