surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Electrical Characterization, Magnetic properties, surface analysis, ... Features: Magnetic fields, ... Techniques: Magneto resistance, Magnetometry, Electrical transport, ... -
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Semiconductors, Spectroscopy, Thin films, ... Features: Automation, Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Liquid crystal, Coating, surface analysis, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Coating, Electronics, Nanoscience, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Microscopy, Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Quantum optics, Magnetic properties, surface analysis, ... Features: Imaging, Vibration Stability, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Nano-Indentation, Intermetallics, Spintronics / magneto-electronics, ... Features: Correlative Analysis, Imaging, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Nano-Indentation, Electronics, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Electron beam, Professional Scientific and Technical Services, Scanning Electron Microscopy, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Nanoscience, Fluorescence/Phosphorescence lifetime imaging, surface analysis, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Nanoscience, Semiconductors, Coating, ... Features: Thermal Stability, Compact / Portable, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Thin films, Coating, surface analysis, ... Features: , Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Semiconductors, Spectroscopy, Microscopy, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Finding new material, Magnetic properties, Nanoscience, ... Features: Magnetic fields, Non Destructive, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Nanoscience, Spectroscopy, Quality control of the product, ... Features: Imaging, Imaging, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Lake Shore ST-100 Optical Cryostat Applications: Semiconductors, Thin films, Fluorescence/Phosphorescence lifetime imaging, ... Features: Low temperature, Vacuum, ... Techniques: Optical spectroscopy, Microscopy, Microscopy, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Fluorescence/Phosphorescence lifetime imaging, Material inspection, Chemical mapping, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ...