surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Thin films, surface analysis, Spintronics / magneto-electronics, ... Features: Magnetic fields, ... Techniques: Magnetometry, Magneto resistance, Torque magnetometry, ... -
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Aerospace, Thin films, Electronics, ... Features: Automation, No External Cooling Requirements, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Quality control of the product, Coating, Spectroscopy, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Material inspection, surface analysis, Spintronics / magneto-electronics, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Nanopositioners, Atomic Force Microscopy, Scanning Electron Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Coating, surface analysis, Patterned magnetic media, ... Features: Vibration Stability, Magnetic fields, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Intermetallics, Quality control of the product, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Electrical Characterization, Electronics, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Professional Scientific and Technical Services, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Fluorescence/Phosphorescence lifetime imaging, Thin films, Quality control of the product, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Electronics, Coating, Nanoscience, ... Features: HV, Customizable chamber, ... Techniques: Sputtering, Physical Vapor Deposition, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Coating, Quality control of the product, Optical crystals, ... Features: Wide Spectral Range, Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Nanoscience, surface analysis, Semiconductors, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Nanoscience, Patterned magnetic media, Intermetallics, ... Features: Ultra high sensibility, Magnetic fields, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Spectroscopy, surface analysis, Thin films, ... Features: Flexible System Integration, Wide Spectral Range, ... Techniques: , , Spectroscopic ellipsometry, ... -
Lake Shore ST-100 Optical Cryostat Applications: Semiconductors, Intermetallics, Spectroscopy, ... Features: Vacuum, Thermal Stability, ... Techniques: , Microscopy, Optical spectroscopy, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Material inspection, Quality control of the product, Nanoscience, ... Features: XANES, X-Ray, ... Techniques: XES, XFAS, ...