surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Electronics, surface analysis, Solar Energy, ... Features: Magnetic fields, ... Techniques: Magneto resistance, Magnetometry, AC Susceptibility, ... -
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: surface analysis, Thin films, Electronics, ... Features: No External Cooling Requirements, Non Destructive, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Thin films, surface analysis, Spectroscopy, ... Features: , Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Coating, Electron Backscatter Diffraction, Patterned magnetic media, ... Features: Imaging, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Atomic Force Microscopy, Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: , Quantum optics, Patterned magnetic media, ... Features: Non Destructive, Vibration Stability, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Finding new material, Quality control of the product, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Microscopy, Nanopositioners, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Thin films, Patterned magnetic media, Electrical Characterization, ... Features: Correlative Analysis, Imaging, ... Techniques: Atomic Force Microscopy, Nanopositioners, Professional Scientific and Technical Services, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Fluorescence/Phosphorescence lifetime imaging, Thin films, Material inspection, ... Features: X-Ray, XANES, ... Techniques: XFAS, XES, ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Electronics, Nanoscience, Thin films, ... Features: Excellent temperature uniformity, Temperature Control, ... Techniques: Sputtering, Physical Vapor Deposition, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Liquid crystal, Spectroscopy, Quality control of the product, ... Features: Fast Spectral Detection, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: surface analysis, Nanoscience, Spectroscopy, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, Magnetoresistance, Finding new material, ... Features: Vibration Stability, Magnetic fields, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Liquid crystal, surface analysis, ... Features: Fast Spectral Detection, Non Destructive, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Lake Shore ST-100 Optical Cryostat Applications: surface analysis, Semiconductors, Spectroscopy, ... Features: Temperature Control, Thermal Stability, ... Techniques: Optical spectroscopy, Microscopy, Microscopy, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Nanoscience, Fluorescence/Phosphorescence lifetime imaging, Material inspection, ... Features: X-Ray, XANES, ... Techniques: XFAS, XES, ...