surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Semiconductors, Magnetic properties, Magnetoresistance, ... Features: Magnetic fields, ... Techniques: Magnetometry, Magneto resistance, Torque magnetometry, ... -
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Electronics, Aerospace, Spectroscopy, ... Features: Imaging, Non Destructive, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Coating, Thin films, Optical crystals, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Nanoscience, Quality control of the product, Spintronics / magneto-electronics, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Microscopy, Atomic Force Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Magnetic properties, Microscopy, Patterned magnetic media, ... Features: Non Destructive, Vibration Stability, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Quality control of the product, Nanoscience, Coating, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Microscopy, Electron beam, Scanning Electron Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Nano-Indentation, Semiconductors, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Atomic Force Microscopy, Scanning Electron Microscopy, Professional Scientific and Technical Services, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Spectroscopy, surface analysis, Fluorescence/Phosphorescence lifetime imaging, ... Features: X-Ray, XANES, ... Techniques: XFAS, XES, ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: surface analysis, Coating, Electronics, ... Features: Compact and easy-to-use, Customizable chamber, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: surface analysis, Thin films, Quality control of the product, ... Features: Fast Spectral Detection, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: surface analysis, Nanoscience, Microscopy, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Thin films, Intermetallics, Coating, ... Features: Non Destructive, Imaging, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Liquid crystal, surface analysis, Spectroscopy, ... Features: Fast Spectral Detection, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Lake Shore ST-100 Optical Cryostat Applications: Spectroscopy, Semiconductors, Thin films, ... Features: Thermal Stability, Temperature Control, ... Techniques: , Optical spectroscopy, Microscopy, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Quality control of the product, Thin films, Material inspection, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ...