surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Semiconductors, Electrical Characterization, surface analysis, ... Features: Magnetic fields, ... Techniques: AC Susceptibility, Magneto resistance, Torque magnetometry, ... -
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Semiconductors, Electronics, Aerospace, ... Features: Non Destructive, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Liquid crystal, Nanoscience, surface analysis, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: surface analysis, Nano-Indentation, Coating, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Electron beam, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Semiconductors, Finding new material, Finding new material, ... Features: Imaging, Non Destructive, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Quality control of the product, Coating, Material inspection, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Electronics, Coating, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Electron beam, Nanopositioners, Professional Scientific and Technical Services, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Spectroscopy, Chemical mapping, Material inspection, ... Features: XANES, X-Ray, ... Techniques: XES, XFAS, ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: surface analysis, Semiconductors, Nanoscience, ... Features: Vacuum, Compact / Portable, ... Techniques: Physical Vapor Deposition, Sputtering, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Quality control of the product, Liquid crystal, surface analysis, ... Features: , Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Coating, Microscopy, Aerospace, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Patterned magnetic media, Nanoscience, Spintronics / magneto-electronics, ... Features: Imaging, Non Destructive, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Coating, Quality control of the product, Spectroscopy, ... Features: Flexible System Integration, Non Destructive, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Lake Shore ST-100 Optical Cryostat Applications: Fluorescence/Phosphorescence lifetime imaging, surface analysis, Semiconductors, ... Features: Temperature Control, Low temperature, ... Techniques: Microscopy, Microscopy, Optical spectroscopy, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Material inspection, Nanoscience, Quality control of the product, ... Features: XANES, X-Ray, ... Techniques: XES, XFAS, ...