surface analysis
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Lake Shore 8400 Series HMS Hall Effect Measurement Systems Applications: Solar Energy, Electrical Characterization, Thin films, ... Features: Magnetic fields, ... Techniques: Electrical transport, Magneto resistance, Magnetometry, ... -
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Thin films, Aerospace, surface analysis, ... Features: Non Destructive, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: surface analysis, Quality control of the product, Spectroscopy, ... Features: Remote Access, Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Quality control of the product, Electron Backscatter Diffraction, Nanoscience, ... Features: Correlative Analysis, SEM Charge-up prevention, ... Techniques: Microscopy, Electron beam, Atomic Force Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: , surface analysis, Thin films, ... Features: Non Destructive, Imaging, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Electrical Characterization, Nano-Indentation, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Microscopy, Scanning Electron Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Electron Backscatter Diffraction, Semiconductors, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Scanning Electron Microscopy, Electron beam, Professional Scientific and Technical Services, ...
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easyXAFS Hard X-Ray Spectrometers Our easyXAFS/XES product line features versatile, hard x-ray spectrometers. Applications: Thin films, Nanoscience, Catalysis, ... Features: XANES, X-Ray, ... Techniques: XFAS, XES, ... -
Korvus Technology HEX Series Sputtering System in a Modular and Versatile Platform Applications: Electronics, Coating, Thin films, ... Features: Excellent temperature uniformity, Compact and easy-to-use, ... Techniques: Sputtering, Physical Vapor Deposition, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Optical crystals, Thin films, Coating, ... Features: , Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Microscopy, Aerospace, Nanoscience, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Spintronics / magneto-electronics, Finding new material, Patterned magnetic media, ... Features: Correlative Analysis, Non Destructive, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Coating, surface analysis, ... Features: Imaging, Wide Spectral Range, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
Lake Shore ST-100 Optical Cryostat Applications: Intermetallics, Thin films, Fluorescence/Phosphorescence lifetime imaging, ... Features: Vacuum, Thermal Stability, ... Techniques: Microscopy, Microscopy, Optical spectroscopy, ... -
easyXAFS Tender X-Ray Spectrometers The BRIMSTONE is a high performance tender x-ray emission spectrometer (2-5 keV). Applications: Catalysis, Chemical mapping, Nanoscience, ... Features: X-Ray, XANES, ... Techniques: XES, XFAS, ...